Optical Connector Alignment Module for Silicon Photonic Testing
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Solution Overview
Problem
Existing test systems face challenges in aligning optical connectors of silicon photonic devices (SPDs) with micron to submicron precision, particularly when SPDs have varying fiber spacings or arrangements, and require reliable coupling without damaging electrical connections.
Innovation Solution
A motion system with robotics and multiple degrees of freedom is used to align optical connectors, incorporating a module with a first optical connector and a motion system that moves in six degrees of freedom, utilizing springs and magnetic or suction mechanisms for precise alignment of optical connectors on SPDs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a motion system with multiple degrees of freedom is used to align optical connectors, then alignment precision is improved, but device complexity increases
Solution Approach 1:
The motion system is divided into multiple independent degrees of freedom, each controlled separately to achieve precise positioning. The system segments the alignment task into translational and rotational components that can be adjusted independently
Solution Approach 2:
The motion system is designed to handle multiple alignment requirements simultaneously through its six degrees of freedom, making it universally applicable to various optical connector configurations and SPD arrangements
2Reliability
If springs and magnetic or suction mechanisms are used for coupling, then reliability of connection is improved, but device complexity increases
Solution Approach 1:
Springs and magnetic or suction mechanisms serve as intermediary elements between the motion system and the optical connector module. These intermediaries provide reliable coupling while isolating the complex control mechanisms from the precision alignment components
Solution Approach 2:
Magnetic or suction mechanisms replace traditional mechanical fastening systems, eliminating the need for screws, clips, or other complex mechanical coupling devices while maintaining reliable connection through non-contact forces
3Manufacturing precision
If the motion system moves the module by single-digit millimeters or less than one millimeter, then manufacturing precision is improved, but difficulty of detecting and measuring increases
Solution Approach 1:
The system incorporates feedback mechanisms that continuously monitor the position and movement of the optical connector module, providing real-time data to control systems to achieve and verify single-digit millimeter or sub-millimeter precision
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Achieves precise alignment of optical connectors on SPDs with single-digit micron accuracy, enabling reliable coupling and testing without damaging electrical connections, adaptable to different SPD configurations.
Implementation Method 1
a motion system configured to move into, and out of, contact with the module. When the motion system is in contact with the module, the motion system is configured to move the module relative to the DUT in order to align the first optical connector to the second optical connector
Implementation Method 2
The test system may include one or more springs between the first plate and the probe card. The one or more springs may bias the first plate above the probe card and enable movement of the module in multiple degrees of freedom
Implementation Method 3
The first plate and the second plate may be magnetically attracted to each other to create connection of the first plate and the second plate in order to enable movement of the module relative to the probe card and the DUT
Implementation Method 4
At least one of the first plate or the second plate may include a suction device configured to apply suction to hold the first plate and the second plate together in order to enable movement of the module relative to the probe card and the DUT
Data Source
AI summary
An example test system includes a probe card configured to contact a device under test (DUT); a module including a first optical connector configured to contact a second optical connector on the DUT, with the first optical connector being for a fiber optic cable; and a motion system configured to move into, and out of, contact with the module. When the motion system is in contact with the module, the motion system is configured to move the module relative to the DUT in order to align the first optical connector to the second optical connector.


