Optical Connector Moving Section for Dual Interface Testing
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Solution Overview
Problem
Existing test apparatus face difficulties in establishing reliable optical connections with devices under test that have optical interfaces, particularly when these devices also have electrical signal interfaces, leading to challenges in simultaneous optical and electrical signal exchange.
Innovation Solution
A device interface apparatus is designed with a device loading section, optical connector, and optical connector moving section to establish both optical and electrical connections with the device under test, utilizing a substrate, socket section, and handler apparatus to facilitate the connection process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a test apparatus uses conventional electrical connection methods, then electrical signals can be transmitted, but optical connection with the device under test cannot be established
Solution Approach 1:
The connection system is divided into separate electrical connection components and optical connection components. The optical connector and optical fiber are segmented as independent elements that can be positioned and connected separately from electrical contacts, allowing each connection type to be optimized independently while working together as a unified interface system.
Solution Approach 2:
An optical fiber acts as an intermediary medium between the test apparatus and the device under test's optical interface. The optical fiber transmits optical test signals from the test apparatus through the optical connector to the device under test, enabling optical communication without direct electrical contact at the optical interface.
2Adaptability or versatility
If the test apparatus attempts to establish both optical and electrical connections simultaneously, then complete testing capability is achieved, but the device complexity increases
Solution Approach 1:
The electrical connection components and optical connection components are merged into a single integrated connection system. The optical connector, electrical contacts, and optical fiber are combined in a unified interface assembly that establishes both electrical and optical connections simultaneously, reducing the need for separate connection mechanisms and simplifying the overall system architecture.
Solution Approach 2:
The connection system is designed with multi-functionality to handle both electrical and optical signaling through a single interface mechanism. The same connection action establishes both electrical contacts and optical fiber alignment, allowing the test apparatus to interface with devices that have both electrical and optical interfaces using one unified connection procedure rather than requiring separate connection systems for each interface type.
Data Source
AI summary
It is an object of the present invention to test a device under test including an optical interface. Provided is a device interface apparatus on which is loaded a device under test including an optical interface. The device interface apparatus comprises a device loading section on which the device under test is loaded; an optical connector that is to be connected to the optical interface of the device under test; and an optical connector moving section that moves the optical connector toward the optical interface of the device under test loaded on the device loading section, to optically connect the optical connector and the optical interface.