Optical Element Decentration and Tilt Measurement
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Solution Overview
Problem
Existing methods for measuring decentration and tilt of optical element faces are inaccurate, time-consuming, and often require costly calibrations, failing to correct aberrations effectively in optical systems.
Innovation Solution
A method and device that register all optically used and frame-relevant partial surfaces and reference faces in a common coordinate system, using whole-area registration and distance measurement sensors, allowing for contactless measurement and simultaneous registration of surfaces, which enables accurate and reproducible establishment of decentration and tilt, suitable for various surface forms including spherical, aspherical, and free-form lenses.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If existing methods are used to measure decentration and tilt of optical element faces, then measurement can be performed, but measurement precision is insufficient and time-consuming calibrations are required
Solution Approach 1:
The patent replaces mechanical measurement systems with optical measurement systems. Optical distance measurement sensors and autocollimators are used to non-contactly measure surface positions and orientations, eliminating the need for mechanical contact and associated time-consuming calibrations while significantly improving measurement precision
Solution Approach 2:
The patent changes the measurement parameters by measuring surface form deviations and using these to calculate decentration and tilt. By measuring the actual surface geometry and comparing it to the intended design, the system directly determines position errors without requiring separate calibration procedures
2Productivity
If existing measurement methods are used, then decentration and tilt can be measured, but the measurement process is time-consuming and costly
Solution Approach 1:
The patent merges multiple measurement functions into a single integrated system. The optical measurement system simultaneously measures surface positions, orientations, and surface form deviations, eliminating the need for separate calibration procedures and multiple measurement devices, thereby improving productivity while reducing device complexity
Solution Approach 2:
The measurement system uses the optical element itself as the measurement target and reference. By measuring the actual surface geometry and comparing it to the intended design specifications, the system performs self-validation without requiring external calibration standards or procedures
3Reliability
If position errors are not accurately measured, then production can proceed quickly, but aberrations cannot be corrected in optical systems
Solution Approach 1:
The patent implements a feedback mechanism by measuring the actual surface positions and orientations, comparing them to the intended design, calculating the position errors (decentration and tilt), and providing this information for correction. This closed-loop approach ensures high measurement precision and enables effective aberration correction in optical systems
Data Source
AI summary
A method and device for measuring a decentration and tilt of faces of an optical element is provided. At least all optically used and frame-relevant partial surfaces of a surface of the optical element and reference faces of the optical element are registered over the whole area thereof and referenced to one another in a common coordinate system, wherein in each case a surface form deviation of the partial surfaces and reference faces is established relative to an associated intended surface, wherein a location of the partial surfaces and reference faces is established in each case in the common coordinate system from the respective surface form deviation. At least one tilt and at least one decentration are established from the location as a function of a form of the respective partial surface and reference face in the coordinate system.