Optical Detection Error Compensation Using Sub-Wavelength Light

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Solution Overview

Problem

Current optical detection devices for lab-on-a-chip systems face limitations in correcting measurement errors due to sample characteristics, foreign bodies, and bubbles, especially when using multiple wavelengths for simultaneous inspection in miniaturized formats.

Innovation Solution

The optical detection apparatus incorporates a light source unit with main wavelength light sources and a sub-wavelength light source arranged along a scan line, where the sub-wavelength light source corrects measurement errors by compensating for differences in incident positions and sample density, enabling accurate detection across multiple detection chambers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple wavelength light sources are arranged at vertex positions of a triangle, then multiple wavelengths detection is supported, but measurement error correction is limited due to varying light emission areas

Engineering Contradiction:

Improvemultiple wavelengths detection capabilityVSAvoidmeasurement error correction accuracy

Core Design Contradiction:

Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The light source arrangement is segmented into distinct functional groups: main wavelength light sources (first, second, third, fourth) positioned at specific locations, and sub-wavelength light sources (fifth, sixth) positioned between them. This segmentation allows each light source to target specific detection chambers independently, enabling both multi-wavelength detection and precise error correction by matching light emission areas with detection chamber positions.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

Different light sources are assigned to different spatial locations and functional roles. The main wavelength light sources are positioned to illuminate specific detection chambers for primary measurement, while sub-wavelength light sources are positioned between them to illuminate adjacent chambers for error correction. This local differentiation ensures that each measurement and correction operation occurs at the appropriate location with the appropriate wavelength.

Inventive Principle:

Principle #3Local quality

2Reliability

If light sources are arranged to cover all detection chambers, then comprehensive measurement is achieved, but device size increases

Engineering Contradiction:

Improvecomprehensive measurement coverageVSAvoiddevice size

Core Design Contradiction:

ReliabilityVSArea of stationary object

Solution Approach 1:

The optical detection device is designed to scan and measure multiple detection chambers using a coordinated system of light sources and detectors. The first through fourth main wavelength light sources and fifth through sixth sub-wavelength light sources work together with corresponding optical detectors to perform both primary measurement and error correction across all detection chambers, allowing comprehensive coverage without requiring separate dedicated components for each chamber.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Solution Approach 2:

Multiple light sources and detectors are integrated into a unified scanning system. The main wavelength light sources and sub-wavelength light sources are combined in a single light source unit, and their corresponding detectors are integrated into one optical detection device. This merging allows the system to perform multiple functions (multi-wavelength detection and error correction across multiple chambers) using a compact, integrated structure rather than separate components for each function.

Inventive Principle:

Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration allows for accurate correction of measurement errors and supports simultaneous multi-wavelength inspection, facilitating miniaturization and weight reduction in lab-on-a-chip devices, enhancing the capability for multiple item testing in small-sized clinical chemical test devices.

Implementation Method 1

main wavelength light sources which are used for measuring samples of detection chambers

Methodology Applied

Scientific EffectLight absorption: Absorption (EM radiation)

Data Source

PatentUS10113964B2Optical detection apparatus and method of compensating detection error

Publication Date: 2018.10.30 PRECISIONBIOSENSOR INC

AI summary

An optical detection apparatus for measuring detection chambers of a specimen cartridge includes: a light source unit including light sources which are arranged along a scan line on which the detection chambers are aligned to be scanned, and configured to emit light rays to the detection chambers; and an optical detector configured to detect the light rays having passed through corresponding detection chambers disposed on the scan line. The light sources include main wavelength light sources which are used for measuring samples disposed in the detection chambers, and a sub-wavelength light source which is used for correcting a measuring error.