Combined Optical Measurement for Workpiece Distance and Temperature
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Solution Overview
Problem
Existing industrial processes, particularly in laser processing, face challenges in simultaneously measuring the temperature and distance of a workpiece or material with high accuracy, often requiring separate and incompatible measurement devices, leading to increased complexity and cost.
Innovation Solution
A combined optical system that alternately measures the distance and temperature of a workpiece or material by detecting probe radiation scattered from the surface and thermal radiation emitted, respectively, using a single or integrated detection device, synchronized with the activation and deactivation of the optical probe radiation source.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If separate measurement devices are used for distance and temperature measurement, then measurement accuracy is improved, but device complexity increases
Solution Approach 1:
The patent combines distance measurement and temperature measurement functions into a single integrated optical system. The system uses a single optical source that alternately emits probe radiation for distance measurement and remains inactive for temperature measurement, with both measurements performed through the same optical path and detection device, thereby reducing device complexity while maintaining measurement accuracy
Solution Approach 2:
The optical system is designed to perform multiple functions: it can measure both distance and temperature using the same hardware components. The detection device is configured to detect both scattered probe radiation (for distance) and thermally emitted radiation (for temperature), making the system universal and eliminating the need for separate measurement devices
2Measurement precision
If separate measurement devices are used for distance and temperature measurement, then measurement accuracy is improved, but system cost increases
Solution Approach 1:
The patent merges distance measurement and temperature measurement into a single system, eliminating the need to manufacture and integrate multiple separate devices. This consolidation reduces material costs, assembly costs, and calibration costs while maintaining the measurement accuracy that would be achieved with separate specialized devices
3Device complexity
If alternating measurement method is used, then system complexity is reduced, but measurement precision may deteriorate
Solution Approach 1:
The system uses periodic action by alternately activating the optical source for distance measurement and keeping it inactive for temperature measurement. This periodic switching allows the same optical path and detection device to be used for both measurements without interference, maintaining measurement precision while simplifying the system architecture
Solution Approach 2:
The system incorporates feedback mechanisms where the control unit coordinates the alternating operation of the optical source and the detection device. The feedback ensures that distance and temperature measurements are properly timed and processed, preventing cross-interference and maintaining measurement accuracy despite the alternating measurement approach
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables simultaneous and accurate measurement of temperature and distance, reducing system complexity and cost while improving the precision and control of industrial processes like laser cutting, welding, and additive manufacturing.
Implementation Method 1
detecting probe radiation scattered from the surface
Implementation Method 2
detecting thermal radiation emitted from the surface
Data Source
AI summary
A combined optical system for determining temperature of the surface of an object or material and its distance with respect to a predetermined reference point associated with the system includes an optical radiation source emitting optical probe radiation at a predetermined wavelength or in a predetermined wavelength range, a source control unit controlling switching of the source from an operative condition, in which it emits optical probe radiation, to an inoperative condition, in which it does not emit optical probe radiation, optical detectors acquiring scattered optical radiation and thermally emitted optical radiation from the surface of the object or material, and a processing unit determining the distance of the surface of the object/material based on scattered optical probe radiation when the source is operative, and the local temperature of the surface of the object/material on the basis of thermally emitted optical radiation when the source is inoperative.


