Optical Electrical Measurement Probe for Dense Circuit Analysis
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Solution Overview
Problem
Existing electrical measurement systems face challenges in simultaneously recording a large number of signals from densely populated circuits due to limited measurement channels and high costs, often requiring expensive probe cards and robots with precise mechanics, which are difficult to implement reliably.
Innovation Solution
A measurement system and method that utilize a measurement probe to convert electrical properties into optical signals, which are then recorded by an image sensor and processed to decode the measurement data, allowing for simultaneous real-time measurement of multiple signals without the need for expensive dedicated probe stations or precise mechanical alignment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If a dedicated probe card with connection pins is used to measure multiple signals, then the number of measurement channels is increased, but the cost and complexity of the measurement system increases proportionally
Solution Approach 1:
The patent replaces traditional electrical connection pins and mechanical probe cards with an optical communication system. Measurement probes convert electrical signals to optical signals that are transmitted through optical fibers to a central measurement device, eliminating the need for extensive electrical connection infrastructure and reducing system complexity and cost.
Solution Approach 2:
The patent introduces optical fibers as an intermediary medium between the measurement probes on the circuit board and the central measurement device. This optical intermediary allows multiple measurement channels to be consolidated into a single communication path, reducing the number of direct electrical connections required.
2Quantity of substance
If the circuit is densely populated with components, then the circuit integration is improved, but the ability to reliably probe signals becomes nearly impossible
Solution Approach 1:
The patent replaces mechanical contact-based probing with optical signaling. Instead of requiring physical contact between probe pins and circuit points, the system uses optical signals transmitted through fibers, which can be positioned more precisely and maintain stable connections even in densely populated circuits.
3Measurement precision
If a dedicated measurement robot with precise actuators is used to move measurement probes, then measurement precision is improved, but the cost and device complexity increases significantly
Solution Approach 1:
The patent replaces the mechanical measurement robot system with a static optical communication architecture. Measurement probes are positioned on the circuit board and connected via optical fibers to a fixed measurement device, eliminating the need for complex robotic positioning mechanisms while maintaining measurement capability.
4Quantity of substance
If the number of measurement channels is increased to monitor modern circuits, then the measurement capability is improved, but the cost of the measurement system becomes very expensive
Solution Approach 1:
The patent merges multiple measurement channels into a unified optical communication system. Multiple measurement probes can share common optical fiber infrastructure and be managed by a single central measurement device, allowing high-channel-count measurement without proportional cost increase.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables reliable and cost-effective simultaneous measurement of multiple signals from densely populated circuits, reducing the need for expensive equipment and allowing for real-time monitoring without interference or noise injection.
Implementation Method 1
converting the measured electrical property of the electrical circuit to an optical signal
Implementation Method 2
receiving the optical signal by means of an image sensor configured to record images comprising the measurement probe that transmits the optical signal
Data Source
Figure 1
Figure 2
Figure 3~5
AI summary
The present invention relates to a system, a measurement probe and a method for measuring an electrical property of an electrical circuit, comprising measuring the electrical property by means of a measurement probe connected to the electrical circuit, converting the measured electrical property of the electrical circuit to an optical signal. The method further comprises sending the optical signal, and receiving the optical signal by means of an image sensor configured to record images comprising the measurement probe that transmits the optical signal. The method further comprises processing the recorded images in order to decode the measurement data from the received optical signal.