Optical Encoder Using Temporal Light Modulation for Absolute Positioning
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Solution Overview
Problem
Conventional optical encoders require complex surface processing and specific markers for accurate position detection, limiting their application and increasing complexity, especially in scenarios where precise position correction is needed.
Innovation Solution
An optical encoder system that includes a light sensing unit and a processing unit capable of detecting markers with patterned lines between blackness regions, generating PWM signals based on pixel distances, and using these signals to determine absolute positions without the need for optical lenses, allowing for precise position correction and reduced hardware size for microminiaturization.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional optical encoding methods are used with markers and light sources, then accurate position detection can be achieved, but the surface processing becomes complicated and application is limited
Solution Approach 1:
The patent extracts the encoding function from the working surface markers and transfers it to the light source itself. The light source is modulated to emit light in specific sequences that directly encode position information, eliminating the need for complex surface markers while maintaining detection accuracy.
Solution Approach 2:
The light source serves multiple functions: it provides illumination for detection and simultaneously encodes position information through temporal modulation. This multi-functionality eliminates the separate encoding markers on the working surface, simplifying the overall system.
2Measurement precision
If special markers with specific density are processed on the working surface, then accurate detection results can be obtained, but the application scope is limited and difficulty increases
Solution Approach 1:
The patent changes the encoding parameter from spatial distribution (marker density and pattern on surface) to temporal modulation (light emission sequence and duration). This parameter transformation allows the same detection system to work with any working surface regardless of its physical characteristics, greatly expanding application scope.
3Measurement precision
If conventional optical encoding with multiple light sources and markers is used, then position data can be generated, but the system size prevents microminiaturization
Solution Approach 1:
The patent merges the light source, encoder, and marker functions into a single integrated system. The light source itself carries the encoding information through temporal modulation, eliminating the need for separate markers and multiple light sources, thereby enabling microminiaturization.
Solution Approach 2:
The patent replaces the mechanical/optical system of physical markers and multiple light sources with an electronic control system that modulates a single light source temporally. This substitution dramatically reduces the physical space required while maintaining encoding capability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate and efficient position detection and correction without complex surface processing, facilitating applications where precise position identification is required, while reducing the size of the optical navigation module for microminiaturization.
Implementation Method 1
detect light reflected from the detection surface
Implementation Method 2
detect a marker at a reference position on a detection surface to capture an image
Data Source
AI summary
The present disclosure is related to an optical encoder which is configured to provide precise coding reference data by feature recognition technology. To apply the present disclosure, it is not necessary to provide particular dense patterns on a working surface. The precise coding reference data can be generated by detecting surface features of the working surface.