Optical Machining Head with Integrated Surface Inspection
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Solution Overview
Problem
Existing optical processing systems require independent adjustments for measurement devices due to their separate inspection optical systems, which complicates the inspection of process surfaces.
Innovation Solution
An optical processing head and apparatus that integrates a light guide portion and an inspection portion, using rays of different wavelengths for processing and inspection, allowing for simultaneous guidance and inspection without interference, and enabling easy adjustment and noise reduction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If an independent measurement device with a separate inspection optical system is used, then the process surface can be inspected, but independent adjustment is required and the system becomes complex
Solution Approach 1:
The patent combines the measurement device and the optical processing head into a single integrated system. The inspection optical system and the processing optical system are merged into one unified optical head, eliminating the need for separate independent adjustment of measurement devices while maintaining inspection capability.
Solution Approach 2:
The optical processing head is designed to perform multiple functions: both optical processing (guiding the processing ray) and inspection (detecting process surface state) are accomplished through the same integrated device, making it a universal tool that eliminates the need for separate measurement devices.
2Device complexity
If rays of the same wavelength are used for both processing and inspection, then a single optical system can be used, but interference and noise occur
Solution Approach 1:
The patent applies different wavelengths (different local properties) to different functions within the same optical system. The processing ray uses one wavelength optimized for material processing, while the inspection ray uses a different wavelength optimized for detection, allowing both functions to coexist without interference.
Solution Approach 2:
The patent changes the wavelength parameter of the rays used for different purposes. By using rays of different wavelengths for processing and inspection respectively, the system avoids interference while maintaining integration, as the different wavelengths can be selectively filtered and detected.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Facilitates easy inspection of process surface states, such as tilt and processing material concentration, improving processing accuracy and reducing noise and interference.
Implementation Method 1
a light guide portion (101) that guides a ray (111, 112) for processing and an inspection ray (112) to a process surface (120)
Implementation Method 2
an inspection portion (102) that inspects a state of the process surface (120) from reflected light (113) of the inspection ray (112) reflected by the process surface (120)
Data Source
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AI summary
This specification discloses an optical processing head including a light guide portion that guides, to a process surface, a ray for processing. The light guide portion is further configured to guide, to the process surface, a ray for inspection different in wavelength from the ray for processing. The optical processing head further includes an inspection portion that inspects the state of the process surface based on reflected light of the ray for inspection reflected by the process surface. With the optical processing head, the state of the process surface can be easily inspected even during optical processing.