Optical Imaging Deconvolution for Coverslip Thickness Errors

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Solution Overview

Problem

Optical microscopy imaging systems face challenges in achieving accurate focus and image quality due to variations in sample holder thickness and curvature, leading to spherical aberrations, especially in high-content screenings, which are exacerbated by higher numerical aperture lenses.

Innovation Solution

An optical imaging system that uses a sample stage, objective lens, optical detector, and processor to capture reference and test images, process these images to calculate a point spread function, and deconvolve sample images to reduce artifacts, eliminating the need for user interaction and correction collar adjustments.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a larger numerical aperture objective lens is used to visualize finer details and collect more light, then image resolution and brightness are improved, but spherical aberration and image distortion become more pronounced

Engineering Contradiction:
Improveimage resolutionVSAvoidspherical aberration
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The system automatically adjusts the correction collar parameter to compensate for spherical aberration caused by coverslip thickness variations. By dynamically changing the correction collar position based on measured thickness, the system maintains optimal image quality with high numerical aperture lenses without manual intervention

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The system implements a feedback loop where coverslip thickness is measured, spherical aberration is calculated based on the thickness deviation, and the correction collar is automatically adjusted to compensate. This closed-loop control eliminates manual adjustment and maintains optimal focus across varying thickness conditions

Inventive Principle:
Principle #23Feedback

2Measurement precision

If manual adjustment of correction collar is used to compensate for spherical aberration, then image quality can be improved, but operator skill and time consumption increase

Engineering Contradiction:
Improveimage qualityVSAvoidoperator skill requirement
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The system performs self-correction by automatically measuring coverslip thickness, calculating the required correction, and adjusting the correction collar without user intervention. This eliminates the need for skilled operators to manually optimize settings while maintaining high image quality

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent replaces manual mechanical adjustment with an automated optical measurement and control system. Instead of relying on operator skill to visually assess and adjust the correction collar, the system uses optical thickness measurement and automatic control mechanisms

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If automatic focus maintenance is performed at each measurement location, then accurate focus can be maintained despite thickness variations, but system complexity and imaging time increase

Engineering Contradiction:
Improvefocus accuracyVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The system performs preliminary measurement of coverslip thickness before imaging and pre-calculates the correction needed. By determining the correction collar position in advance based on thickness measurement, the system avoids complex real-time adjustments during imaging while maintaining focus accuracy

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method improves image quality by reducing artifacts and spherical aberrations, enabling efficient imaging without manual user intervention, particularly in high numerical aperture systems.

Implementation Method 1

retrieve test image data from a test image captured from light reflected from a top surface of the sample coverslip at a focal plane of the objective lens

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentUS20250264708A1Methods and systems to compensate for substrate thickness error
Publication Date: 2025.08.21 MOLECULAR DEVICES LLC
  • US20250264708A1 patent drawing
  • US20250264708A1 patent drawing
  • US20250264708A1 patent drawing

AI summary

Systems and method for imaging a sample of a top surface of a sample coverslip which capture a sample image of the sample on the top surface of the sample coverslip using an objective lens disposed underneath the sample coverslip. Capture reference image data obtained from light reflected from a top surface of a calibration coverslip, capture test image data obtained from light reflected from a top surface of the sample coverslip, process die reference image data and the test image data to produce a calculated point spread function associated with the objective lens and the coverslip in use, and deconvolve the sample image using the calculated point spread function to thereby reduce artifacts from the sample image.