Optical Inspection Overlay for Contamination Detection
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Solution Overview
Problem
Existing optical inspection methods fail to reliably detect contamination spots in the beam path of optical inspection units, leading to sporadic false rejections and increased false rejection rates, as these spots are only detected when they cause multiple consecutive poor inspection results.
Innovation Solution
A method that overlays image data from multiple containers to amplify the image signal of contamination spots in an overlay image, while attenuating defects on individual containers, allowing early detection and initiation of cleaning measures without interrupting regular operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If contamination spots in the beam path are detected only when they cause multiple consecutive poor inspection results, then the false rejection rate is significantly increased, but slight contamination that does not lead to consecutive poor inspection results remains undetected
Solution Approach 1:
The system performs preliminary detection of contamination spots by overlaying image data from multiple containers before making inspection decisions. This preliminary action allows the system to identify contamination in the beam path early, adjusting inspection sensitivity proactively rather than waiting for consecutive poor results, thus maintaining both high reliability and operational efficiency
Solution Approach 2:
The system implements a feedback mechanism where inspection results from multiple containers are continuously monitored and fed back to adjust detection sensitivity. When contamination spots are detected through image overlay analysis, the system automatically adjusts inspection parameters to account for the contamination, preventing false rejections while maintaining detection accuracy
2Measurement precision
If image data from multiple containers is overlaid to amplify contamination spots, then detection precision is improved, but processing complexity increases
Solution Approach 1:
The image processing is segmented into distinct functional modules: image acquisition from multiple containers, overlay/composition of images, contamination spot detection through signal amplification, and separate evaluation of container defects. This segmentation allows complex image processing to be managed through specialized sub-routines, reducing overall system complexity while maintaining high detection precision
Solution Approach 2:
The patent introduces an intermediary overlay image that combines data from multiple container images. This intermediary representation serves as a mediator between raw image data and final contamination detection, amplifying contamination signals while allowing separate processing of container-specific defects, thus managing complexity through intermediate data structures
3Reliability
If cleaning of the optical inspection unit is performed frequently to prevent false rejections, then false rejection rate is reduced, but operational efficiency decreases due to interruptions
Solution Approach 1:
The system performs preliminary detection of contamination spots through image overlay analysis, identifying contamination before it causes significant false rejections. This allows cleaning to be scheduled proactively during planned maintenance windows or container changes rather than in response to performance degradation, minimizing operational interruptions
Solution Approach 2:
The system continuously monitors inspection quality metrics and provides feedback on contamination levels. This feedback enables predictive maintenance scheduling, where cleaning is performed based on actual contamination accumulation rather than fixed schedules, optimizing the balance between inspection accuracy and operational continuity
Data Source
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Figure 3A~3C
AI summary
Method (100) for optical inspection of containers (2), wherein the containers (2) are transported as a container mass flow by a conveyor (3) (101), wherein the containers (2) are each captured as first image data (I1, I2) by an optical inspection unit (4) (102), and wherein the first image data (I1, I2) are evaluated by an image processing unit (5) for contamination and/or defects (D) on the respective container (2) (103), wherein the first image data (I1, I2) of several containers (2A, 2B) are superimposed to form a superimposed image (U1) (108), and wherein the superimposed image (U1) is evaluated for the presence of contamination points (V) in a beam path of the optical inspection unit (4) (109).