Multi-Wavelength Optical Inspection for Surface Asperity Detection

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing methods for acquiring detailed information of an object surface in a non-contact manner are limited in their ability to differentiate between smooth surfaces and surfaces with minute asperities, particularly in terms of color and light reflection characteristics.

Innovation Solution

An optical apparatus and method that utilizes a light emission portion to emit light of multiple wavelengths, combined with an image-forming optical element array and wavelength emission surfaces, to irradiate an object surface with light of different wavelength spectra, allowing for the detection of surface features through color and light reflection analysis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If light of a single wavelength spectrum is used to illuminate the object surface, then the measurement process is simple and fast, but the ability to differentiate between smooth surfaces and surfaces with minute asperities is insufficient

Engineering Contradiction:
Improvesurface differentiation capabilityVSAvoidillumination system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The illumination system is segmented into multiple independent wavelength emission regions (first wavelength emission region, second wavelength emission region, etc.), each emitting light of a specific wavelength spectrum. This segmentation allows selective illumination of the object surface with different wavelength spectra, enabling differentiation between smooth surfaces and asperity-bearing surfaces while maintaining manageable system complexity through modular design

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system changes the wavelength spectrum parameter of the incident light by selecting different emission regions. By varying the wavelength spectrum from single-wavelength to multi-wavelength illumination, the system achieves enhanced surface differentiation capability without fundamentally changing the overall system architecture, thus improving measurement precision while controlling device complexity

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If light of multiple wavelength spectra is emitted from the same emission surface, then surface information acquisition is enhanced, but the light emission structure becomes complex

Engineering Contradiction:
Improvesurface feature detection accuracyVSAvoidwavelength emission structure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The wavelength emission surface is segmented into multiple independent emission regions, with each region responsible for emitting light of a specific wavelength spectrum. This segmentation allows the system to achieve multi-wavelength illumination capability while maintaining a relatively simple overall structure, as each emission region can be independently designed and controlled without requiring complex integrated wavelength selection mechanisms

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system adds the wavelength dimension to the illumination approach by incorporating multiple wavelength emission regions alongside the spatial emission structure. This dimensional expansion enables simultaneous multi-wavelength illumination without significantly increasing the spatial complexity of the emission surface, thereby improving surface feature detection accuracy while controlling structural complexity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If conventional single-wavelength illumination is used, then the device structure is simple, but the reliability of surface information acquisition is insufficient

Engineering Contradiction:
Improvesurface information acquisition reliabilityVSAvoidillumination system structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The system enhances reliability by changing the wavelength spectrum parameter from single-wavelength to multi-wavelength illumination. By incorporating multiple wavelength emission regions that emit different wavelength spectra, the system can acquire more comprehensive surface information and improve the reliability of surface feature detection while maintaining a relatively simple overall device structure through modular emission region design

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enhances the ability to accurately distinguish between smooth and asperity-bearing surfaces by utilizing multiple wavelength spectra, improving the reliability of surface information acquisition and enabling uniform illuminance distribution for precise observation.

Implementation Method 1

a light emission portion configured to emit light

Methodology Applied
Scientific EffectLight emission: Light

Implementation Method 2

an image-forming optical element array configured to transmit the light emitted by the light emission portion toward the object

Methodology Applied
Scientific EffectOptical focusing and transmission: Lens

Implementation Method 3

acquiring reflected light and transmitted light using an image sensor

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentUS20250383287A1Optical apparatus, optical inspection system, and optical inspection method
Publication Date: 2025.12.18 KK TOSHIBA
  • US20250383287A1 patent drawing
  • US20250383287A1 patent drawing
  • US20250383287A1 patent drawing

AI summary

According to an embodiment, an optical apparatus includes: a light emission portion configured to emit light; an image-forming optical element array; and first and second wavelength emission surfaces. The image-forming optical element array includes first and second image-forming optical elements. The second wavelength emission surface is arranged at a position different from the first wavelength emission surface. The first and second wavelength emission surface respectively include: a first wavelength emission region configured to emit by the light, light of a first wavelength spectrum toward the image-forming optical element array; and a second wavelength emission region configured to emit by the light, light of a second wavelength spectrum toward the image-forming optical element array. The first wavelength emission surface is positioned at a focal plane of the first image-forming optical element. The second wavelength emission surface is positioned at a focal plane of the second image-forming optical element.