Optical Interface Interferometry for Simultaneous Assembly Measurement
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Solution Overview
Problem
Existing measurement devices require turning over individual optical components to measure their surfaces, limiting the ability to assess optical assemblies accurately and efficiently.
Innovation Solution
A measurement device and method using low-coherence light sources and interferometric techniques to simultaneously measure the shapes and positioning of multiple interfaces within an optical element without the need to turn it over, employing multiple reference beams and digital processing to analyze interference signals for precise geometric and optical shape determination.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If individual optical components are measured using traditional interferometric techniques, then measurement precision is achieved, but the device requires turning over components and cannot measure optical assemblies accurately
Solution Approach 1:
The measurement device divides the optical element into multiple interfaces that can be measured simultaneously at different positions. By segmenting the measurement process into parallel measurement paths (first and second measurement beams targeting first and second interfaces respectively), the system can measure multiple interfaces of an optical assembly without turning over components, resolving the contradiction between measurement precision and adaptability.
Solution Approach 2:
The invention transitions from measuring a single interface to measuring multiple interfaces simultaneously by adding a spatial dimension to the measurement process. The interferometric device is configured to direct measurement beams to different interfaces at different positions, enabling three-dimensional characterization of optical elements without physical manipulation.
2Measurement precision
If traditional interferometric measurement is used for individual components, then measurement accuracy is achieved, but measurement time increases and productivity decreases
Solution Approach 1:
The device merges multiple measurement operations into a single simultaneous measurement process. By combining the measurement of first and second interfaces into one interferometric measurement sequence using multiple reference beams, the system eliminates sequential measurement steps and significantly reduces total measurement time while maintaining high precision through the interferometric technique.
Solution Approach 2:
The measurement system maintains continuous operation by simultaneously measuring multiple interfaces without interruption. The interferometric device continuously acquires interference signals from multiple interfaces in parallel, eliminating idle time between measurements and maximizing productivity while preserving measurement accuracy through continuous interferometric analysis.
3Measurement precision
If multiple interfaces are measured sequentially, then measurement precision can be maintained, but measurement time increases and handling errors increase
Solution Approach 1:
The measurement device performs preliminary configuration of multiple reference beams and measurement paths before actual measurement begins. By pre-positioning the interferometric system to simultaneously target multiple interfaces, the device eliminates the need for sequential adjustment and handling during measurement, reducing both time loss and handling errors while maintaining precision.
Solution Approach 2:
The system creates multiple copies of the measurement process by using multiple reference beams that simultaneously interfere with measurement beams from different interfaces. This copying approach allows parallel measurement of multiple interfaces without requiring sequential handling, reducing measurement time and minimizing errors while preserving precision through replicated interferometric analysis.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables simultaneous and accurate measurement of multiple interfaces in an optical assembly, providing precise geometric and optical shape information, including tilt and decentring, while minimizing errors from vibrations and handling.
Implementation Method 1
an interferometric device illuminated by said light source or sources and configured for: shaping at least one measurement beam and at least two reference beams, directing said at least one measurement beam to the optical element so as to pass through the interfaces to be measured, directing the light coming from at least two interfaces to be measured, to the optical sensor or sensors, said optical sensor or sensors being globally configured to detect selectively at least two interference signals resulting respectively from interferences between the at least one measurement beam reflected by one of said at least two interfaces to be measured and one of the at least two reference beams
Data Source
AI summary
A device for interface shape of an optical element including at least one low-coherence light source, at least one optical sensor, an interferometric device illuminated by the light source and configured for shaping at least one measurement beam and at least two reference beams, directing one measurement beam to the element to pass through the interfaces, and directing the light from at least two interfaces to the sensor or sensors, each sensor globally configured for detecting at least two interference signals resulting respectively from interferences between the measurement beam reflected by one of the at least two interfaces and one of the reference beams; the measurement device also including a positioner for positioning a coherence area at the level of each interface and a digital processor for producing, from the interference signals, an item of information of the shape of each interface according to a field of view.