Optical Interface Thermal Resistance Mapping
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Solution Overview
Problem
Current methods lack effective approaches to understand and measure the interface thermal resistance mechanism, which is crucial for reducing thermal resistance and improving heat management in materials like semiconductor devices, as they fail to provide a distribution of interface thermal resistance for analyzing local thermal resistance factors.
Innovation Solution
An interface information identification device that uses a light source to heat a sample with overlapping layers, homogenizes light intensity, and detects temperature distributions on the surface of one layer to identify interface thermal resistance and other information, such as fatigue, by analyzing the temperature data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional measurement methods are used, then measurement simplicity is maintained, but interface thermal resistance distribution cannot be obtained
Solution Approach 1:
The patent replaces conventional mechanical contact-based thermal measurement methods with optical methods. A light source irradiates the sample surface to generate heat, and an infrared camera non-contactly measures temperature distribution. This substitution enables precise measurement of interface thermal resistance distribution without mechanical contact, resolving the contradiction between measurement precision and device complexity
Solution Approach 2:
The patent introduces light as an intermediary to transfer energy to the sample and infrared radiation as an intermediary to carry temperature information from the sample to the detector. These intermediaries enable indirect measurement of interface thermal resistance distribution, achieving high measurement precision while maintaining relatively simple device configuration
2Measurement precision
If light intensity is not homogenized, then irradiation setup is simpler, but temperature distribution measurement accuracy deteriorates
Solution Approach 1:
The patent applies local quality by making different parts of the light irradiation system have different functions: the light source provides energy, the diffusing plate homogenizes intensity distribution across the sample surface, and the infrared camera detects temperature. This functional differentiation in the irradiation system ensures uniform heating and accurate temperature measurement without excessive complexity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the measurement of interface thermal resistance and thermal diffusivity as distributions, providing insights into heat transport phenomena and allowing for the evaluation of thermal resistance factors, thereby improving heat management in materials.
Implementation Method 1
a light source configured to emit light to heat a sample
Implementation Method 2
a detecting unit configured to detect a temperature distribution on a surface of the second layer of the sample
Data Source
AI summary
An interface information identification device of the present disclosure includes: a light source configured to emit light to heat a sample, the sample including a first layer and a second layer overlapping the first layer; an irradiating unit configured to homogenize an intensity distribution of light from the light source to irradiate an entire surface of the first layer of the sample with the light; a detecting unit configured to detect a temperature distribution on a surface of the second layer of the sample; and an identifying unit configured to identify information about an interface between the first layer and the second layer of the sample based on the temperature distribution detected by the detecting unit.