Non-Contact Optical Detection System for LED Arrays

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing detection methods for light-emitting diodes (LEDs) face challenges due to the small size of LEDs, making it difficult to align probes with electrodes, leading to potential defects and wear, and requiring labor-intensive and time-consuming processes for detection.

Innovation Solution

A detection system comprising an illumination module, a sensing module, and a processing part, where the sensing module includes a carrier mechanism, a first substrate, a control layer, a sensing layer, and an electrical connection element, ensuring that the sensing surface is the closest point to the element under test, preventing contact and enabling non-contact detection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a probe is used to contact the electrodes of light-emitting diodes for detection, then detection can be performed, but it causes wear of the probe and potential defects in the electrodes

Engineering Contradiction:
Improvedetection reliabilityVSAvoidprobe wear and electrode defects
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent replaces the mechanical contact-based probe detection system with a non-contact optical detection system. The illumination module emits light that passes through the element under test, and the sensing module detects the transmitted light to determine electrical properties without physical contact. This substitution eliminates probe wear and electrode defects while maintaining detection reliability.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent introduces light as an intermediary medium between the illumination module and the sensing module to detect the electrical properties of the element under test. The light acts as a mediator that carries information about the electrical characteristics without requiring direct contact, thus avoiding harmful mechanical interactions.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Manufacturing precision

If a probe with an extremely small tip is manufactured to match the size of LED electrodes, then alignment accuracy improves, but manufacturing difficulty increases significantly

Engineering Contradiction:
Improveprobe alignment accuracyVSAvoidprobe manufacturing difficulty
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent eliminates the need for manufacturing extremely small probe tips by replacing the mechanical probe system with an optical detection system. The illumination module and sensing module can be manufactured with standard precision, and the non-contact optical method provides sufficient resolution to detect small LED electrodes without requiring miniaturized mechanical components.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Reliability

If the probe sequentially contacts multiple electrodes of multiple light-emitting diodes for detection, then detection can be performed, but the detection process becomes labor-intensive and time-consuming

Engineering Contradiction:
Improvedetection completenessVSAvoiddetection speed
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent merges the detection of multiple electrodes and multiple light-emitting diodes into a single simultaneous operation. The illumination module illuminates the entire array of elements, and the sensing module detects all elements at once, eliminating the need for sequential probing. This dramatically increases productivity while maintaining complete detection coverage.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The optical detection system is designed to detect multiple elements simultaneously with a single configuration, making the system universal for detecting arrays of light-emitting diodes. The illumination and sensing modules can detect electrical properties across the entire array without repositioning or reconfiguration, enabling rapid massive detection.

Inventive Principle:
Principle #6Universality (Multi-functionality)

4Reliability

If circuits or components in the sensing module extend beyond the sensing surface height, then electrical connection is improved, but contact with the element under test occurs causing detection failures

Engineering Contradiction:
Improveelectrical connection reliabilityVSAvoiddetection accuracy
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The patent replaces the mechanical electrical connection system with an optical detection system. The sensing module detects electrical properties through optical measurements without requiring physical circuits to extend close to or contact the element under test. This eliminates the risk of contact while maintaining reliable detection of electrical characteristics.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The detection system facilitates rapid and massive detection of light sources by preventing contact between the sensing module and the element under test, reducing the risk of defects and wear, and streamlining the detection process.

Implementation Method 1

The illumination module is configured to provide an illumination beam to the element under test. The illumination beam includes multiple sub-beams of different wavelengths.

Methodology Applied
Scientific EffectLight: Light

Implementation Method 2

The sensing module is configured to sense the element under test to obtain an electrical signal.

Methodology Applied
Scientific EffectPhotoelectric Effect: Photoelectric Effect

Data Source

PatentUS20250199055A1Detection system
Publication Date: 2025.06.19 IND TECH RES INST
  • US20250199055A1 patent drawing
  • US20250199055A1 patent drawing
  • US20250199055A1 patent drawing

AI summary

A detection system is provided for detecting an element under test. The detection system includes an illumination module, a sensing module, and a processing part. The illumination module provides an illumination beam to the element under test. The illumination beam includes sub-beams of different wavelengths. The sensing module senses the element under test to obtain an electrical signal, and includes a carrier mechanism, a first substrate, a control layer, a sensing layer, and an electrical connection element. The sensing layer is disposed on a first surface of the first substrate, and has a sensing surface that is the surface closest to the element under test in the sensing module. The electrical connection element is electrically connected to the sensing layer and the control layer. The processing part is electrically connected to the illumination module and the sensing module, and configured to generate a sensing result according to the electrical signal.