Optical Link MPI Location Detection Using Adjustable Reflector

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional techniques can determine multipath interference (MPI) in optical links but fail to accurately locate the optical elements causing this interference, hindering effective remedial actions.

Innovation Solution

A system and method that utilize an adjustable reflector (AR) to receive and process optical signals, calculate time delays, and compute relative delays to identify the location of optical elements contributing to MPI by comparing delays between reflections within the optical link and those with the AR, generating a map of optical elements to pinpoint the sources of interference.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional techniques are used to determine MPI, then MPI measurement is achieved, but location of optical elements causing MPI cannot be identified

Engineering Contradiction:
ImproveMPI measurement capabilityVSAvoidlocation information of optical elements
Core Design Contradiction:
Measurement precisionVSLoss of information

Solution Approach 1:

An adjustable reflector is introduced as an intermediary element in the optical link. This reflector creates known reflection points that serve as reference markers, enabling the system to determine the locations of unknown optical elements by comparing their reflection characteristics against the known reflector positions.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The system creates a virtual map by copying the physical optical link structure. By measuring time delays and comparing them with the known reflector positions, the system constructs a replicated representation of the optical link that includes location information of all optical elements, thereby recovering the lost spatial information.

Inventive Principle:
Principle #26Copying

2Measurement precision

If an adjustable reflector is added to detect optical element locations, then location identification capability is improved, but device complexity increases

Engineering Contradiction:
Improveoptical element location identificationVSAvoidsystem structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The adjustable reflector serves multiple functions: it acts as a known reference point for location measurement, creates additional reflection signals for time delay analysis, and provides a controllable element that can be adjusted to optimize measurement conditions. This multi-functionality justifies the addition of the reflector despite the increased device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for precise identification of optical elements causing MPI, enabling targeted remedial actions to reduce interference and improve optical link performance.

Implementation Method 1

receive a plurality of second type of delayed optical signals due to reflections of the optical signal between an adjustable reflector (AR) and the plurality of optical elements

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentUS12088337B2Systems and methods for detecting a location of the optical elements causing multipath interference in an optical link
Publication Date: 2024.09.10 HUAWEI TECH CO LTD
  • US12088337B2 patent drawing
  • US12088337B2 patent drawing
  • US12088337B2 patent drawing

AI summary

The disclosed systems and methods for detecting a location of reflection in an optical link comprising: i) receiving an optical signal; ii) receiving a plurality of first type of delayed optical signals corresponding to the optical signal; iii) determining a first type of time delays associated with each of the plurality of first type of delayed optical signals; iv) receiving a plurality of second type of delayed optical signals corresponding to the optical signal; v) determining a second type of time delays associated with the each of the plurality of second type of delayed optical signals; vi) computing relative delays from the second type of time delays; vii) comparing the relative delays with the first type of time delays; and viii) determining a location of a given optical element contributing to the reflections based on the given relative delay and the location of the AR.