Optical Markings for Contact Alignment in Electrical Testing
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Solution Overview
Problem
Existing electrical testing methods face challenges in quickly and accurately aligning contacts on a contact-making apparatus with mating contacts on a unit under test, especially when dealing with multiple identical or similar contact patterns, leading to potential errors and prolonged alignment times.
Innovation Solution
The method involves using optical markings on the contact-making apparatus to facilitate precise alignment by detecting these markings relative to the unit under test, allowing for automatic and error-free contact establishment, with the option for multiple markings and different structures for coarse and fine alignment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If optical detection is performed only at significant points (corner contacts) to speed up the test process, then testing time is reduced, but the risk of incorrect position calculation increases
Solution Approach 1:
The patent introduces optical markings as intermediary reference elements between the contact-making apparatus and the unit under test. These markings serve as mediators that provide unambiguous reference points for optical detection, eliminating the ambiguity of detecting multiple identical contact patterns. The markings are specifically designed to be detectable by the optical device and provide precise positional information without requiring detection of all contacts.
2Measurement precision
If all contacts are detected by the optical device to ensure accurate positioning, then position calculation accuracy is improved, but the alignment process time increases significantly
Solution Approach 1:
The patent extracts the essential positioning information function from the complete set of contacts and concentrates it into discrete optical markings. Instead of requiring the optical device to process information from all contacts, the markings contain the critical positional data that enables accurate alignment. This extraction approach maintains measurement precision while dramatically reducing the detection and processing time required for alignment.
3Productivity
If multiple identical contact patterns are present in the contact-making apparatus, then the contact-making apparatus can test multiple IC chips on a wafer simultaneously, but the risk of incorrect contact pattern selection increases
Solution Approach 1:
The patent introduces asymmetric optical markings that break the symmetry of identical contact patterns. Each optical marking has a unique configuration (different shapes, positions, or patterns) that distinguishes it from other markings on the contact-making apparatus. This asymmetry enables the optical detection system to unambiguously identify and select the correct contact pattern, eliminating the risk of incorrect selection while maintaining the ability to test multiple chips simultaneously.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables rapid, precise, and error-free alignment of contacts, reducing the risk of incorrect positioning and speeding up the testing process, even in cases of multiple probing, by using optical markings to determine the relative positions of contacts and mating contacts.
Implementation Method 1
at least one marking on the contact-making apparatus, which is in a defined position with respect to at least one of the contacts, is detected optically for position determination
Data Source
AI summary
A contact-making apparatus for electrical connection of a unit under test to an electrical test device, having a plurality of electrical contacts which are associated with at least one holding element. The contact-making apparatus and preferably the holding element thereof, is provided with at least one marking which is in a defined position with respect to at least one of the contacts. The marking is detected for alignment of the apparatus and the unit. A corresponding method of use and a method of manufacture are also disclosed.