Optical Measurement System Roughness Correction

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Solution Overview

Problem

Existing measurement systems struggle to precisely measure the uneven shape of large objects in a short time, particularly when using non-contact methods, due to factors like angle of incidence, measurement distance, and light intensity.

Innovation Solution

A measurement system that includes a light source emitting irradiation light to multiple measurement points on an object's surface, an optical detector receiving reflected light, and a processing circuit that calculates and corrects a roughness parameter based on the detection signal, considering the angle of incidence, measurement distance, and light intensity.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If non-contact measurement system is used to measure large object, then measurement time is reduced, but measurement precision deteriorates due to angle of incidence, measurement distance, and light intensity variations

Engineering Contradiction:

Improvemeasurement speedVSAvoidroughness parameter accuracy

Core Design Contradiction:

ProductivityVSMeasurement precision

Solution Approach 1:

The patent applies parameter changes by dynamically adjusting measurement parameters (angle of incidence, measurement distance, light intensity) to compensate for their variations during measurement. The processing circuit corrects the roughness parameter by considering these parameter variations, thereby maintaining measurement precision while using non-contact methods for fast measurement of large objects.

Inventive Principle:

Principle #35Parameter changes

Solution Approach 2:

The patent implements feedback by using the detected roughness parameter and measurement parameters (angle of incidence, measurement distance, light intensity) to correct the final measurement result. The processing circuit receives detection signals, calculates the roughness parameter, and then corrects it based on the measured parameter variations, ensuring accurate results despite the advantages of non-contact measurement.

Inventive Principle:

Principle #23Feedback

2Loss of time

If non-contact measurement system is used, then measurement time is reduced, but measurement precision deteriorates

Engineering Contradiction:

Improvemeasurement timeVSAvoidsurface unevenness accuracy

Core Design Contradiction:

Loss of timeVSMeasurement precision

Solution Approach 1:

The patent compensates for measurement precision deterioration by introducing correction mechanisms that account for parameter variations (angle of incidence, measurement distance, light intensity). The processing circuit calculates correction values based on these parameters and applies them to the roughness parameter, thereby maintaining high precision while preserving the time efficiency of non-contact measurement.

Inventive Principle:

Principle #35Parameter changes

Solution Approach 2:

The system uses feedback by continuously monitoring measurement parameters and using them to correct the final measurement result. The processing circuit receives both the detection signal and parameter information, then applies correction algorithms to eliminate the precision loss that would otherwise occur in non-contact measurement systems.

Inventive Principle:

Principle #23Feedback

3Device complexity

If roughness parameter is calculated without correction, then processing is simpler, but measurement accuracy deteriorates due to parameter variations

Engineering Contradiction:

Improveprocessing circuit complexityVSAvoidroughness parameter accuracy

Core Design Contradiction:

Device complexityVSMeasurement precision

Solution Approach 1:

The patent balances complexity and accuracy by implementing a correction mechanism that considers parameter variations (angle of incidence, measurement distance, light intensity). The processing circuit is designed to calculate the roughness parameter and then apply corrections based on these parameters, achieving high measurement accuracy while keeping the processing circuit complexity manageable through systematic correction algorithms.

Inventive Principle:

Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The system enables precise measurement of an object's uneven shape in a short time by correcting for various factors, improving measurement accuracy and efficiency.

Implementation Method 1

an optical detector that receives reflected light returned from the multiple measurement points

Methodology Applied

Scientific EffectReflection: Reflection

Data Source

PatentUS20250035434A1Measurement system and measurement method

Publication Date: 2025.01.30 PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO LTD

AI summary

A measurement system includes a light source, an optical detector, and a processing circuit. The light source emits irradiation light to be applied to multiple measurement points included in at least one evaluation region of a surface of an object. The optical detector receives reflected light returned from the multiple measurement points and outputs a detection signal. The processing circuit calculates and outputs a roughness parameter regarding an uneven shape of the at least one evaluation region, based on the detection signal. The processing circuit corrects the roughness parameter in accordance with an angle of incidence of the irradiation light incident on the at least one evaluation region, a measurement distance in the at least one evaluation region, or intensity of received light obtained as a result of the at least one evaluation region being irradiated with the irradiation light.