Optical Measuring Device Single Scan Level Difference Analysis
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Solution Overview
Problem
Existing optical measuring devices require multiple scans to measure level differences, making them larger and more expensive than necessary, and thus difficult to use for applications like measuring crank shaft sizes effectively.
Innovation Solution
An optical measuring device that emits scanning light with a parallel optical axis, using a light receiving element to perform photoelectric conversion and calculate distance based on voltage wave changes from a single scan, allowing for the measurement of level differences by determining the time range between interruptions and non-interruptions of the light by the object.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple scans are performed to measure level differences, then measurement accuracy is improved, but measurement time and device complexity increase
Solution Approach 1:
The patent segments the voltage wave into distinct portions corresponding to different light interruption states (fully interrupted, partially interrupted, not interrupted). By analyzing the time ranges of these segmented wave portions, the system can calculate level difference sizes from a single scan without requiring multiple scans, thus resolving the contradiction between measurement accuracy and measurement time.
2Measurement precision
If multiple scans are performed to measure level differences, then measurement accuracy is improved, but device size and cost increase
Solution Approach 1:
The patent segments the voltage wave to extract measurement information from a single scan, eliminating the need for multiple scanning systems or complex multi-scan apparatus. This segmentation approach maintains measurement accuracy while significantly simplifying the device structure and reducing costs.
Solution Approach 2:
The patent extracts the necessary measurement information directly from the voltage wave segments obtained during a single scan. By taking out and analyzing the relevant time range data from the voltage wave, the system achieves accurate level difference measurement without requiring additional complex hardware or multiple scans.
3Device complexity
If scanning light is used with parallel optical axis, then device size is reduced, but the ability to measure level differences in a single scan is compromised
Solution Approach 1:
The patent changes the parameter analysis approach by examining the voltage wave's time range characteristics corresponding to different light interruption states. By analyzing parameters such as the start and end times of fully interrupted, partially interrupted, and non-interrupted wave portions, the system achieves accurate level difference measurement from a single scan using simple parallel optical axis scanning.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the measurement of level differences with a single scanning operation, reducing the size and cost of the device while maintaining accuracy, and allowing for precise calculation of level differences without the need for larger and more expensive shaft measuring devices or projectors.
Implementation Method 1
a light receiving element configured to perform photoelectric conversion with respect to the scanning light after passing over the object
Data Source
AI summary
An optical measuring device includes: an emission device configured to emit a scanning light, of which an optical axis parallelly moves, to an object; a light receiving element configured to perform photoelectric conversion with respect to the scanning light after passing over the object; a calculation device configured to calculate, from a voltage wave obtained from time change of an electrical signal that is output by the light receiving element, a distance corresponding to a time range from a first edge with respect to a voltage value where the scanning light is not interrupted by the object and a second edge with respect to a voltage value where the scanning light is interrupted by the object, when a part of the scanning light is interrupted by the object for the time range.