Optical Modulator Robust to Fabrication Misalignment

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Solution Overview

Problem

Existing optoelectronic integrated circuits face challenges in maintaining alignment and balance of p-n junctions during fabrication, leading to misalignment-induced overlap region size imbalances and modulation inefficiencies in optical modulators.

Innovation Solution

The design incorporates back-to-back-junction components (BBJCs) with A-type and B-type p-n junctions disposed in specific directions, aligned with optical components to ensure consistent overlap regions, using metal bridges to maintain size equality regardless of fabrication misalignment, and optical waveguides to propagate signals effectively.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional fabrication processes are used to create p-n junctions and optical components separately, then manufacturing simplicity is maintained, but misalignment between layers occurs leading to overlap region size imbalances

Engineering Contradiction:
Improvealignment precisionVSAvoidfabrication pattern complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent combines the fabrication patterns for p-n junctions and optical components into a unified pattern system. The p-n junction fabrication pattern and optical component fabrication pattern are integrated such that they share common alignment references and coordinate systems, allowing simultaneous fabrication with reduced misalignment. This merging of previously separate fabrication processes into a coordinated unified process directly addresses the alignment precision problem while managing fabrication complexity.

Inventive Principle:
Principle #5Merging (Combining)

2Manufacturing precision

If p-n junctions are fabricated with standard lithography masks, then ease of manufacture is maintained, but misalignment-induced overlap region size imbalances occur

Engineering Contradiction:
Improveoverlap region size consistencyVSAvoidfabrication process simplicity
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent implements preliminary alignment mark fabrication and pattern registration setup before actual p-n junction and optical component fabrication. Alignment marks are created in advance on the substrate, and the lithography masks are pre-calibrated to these marks. This preliminary action ensures that when the actual fabrication occurs, the overlap regions between p-n junctions and optical components maintain consistent sizes despite the complexity of coordinated fabrication.

Inventive Principle:
Principle #10Preliminary action

3Reliability

If fabrication misalignment is accepted as inevitable, then manufacturing simplicity is maintained, but modulation efficiency becomes unbalanced across optical arms

Engineering Contradiction:
Improvemodulation efficiency balanceVSAvoidfabrication alignment accuracy
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent employs asymmetric compensation structures where the p-n junction fabrication pattern and optical component fabrication pattern are designed with intentional asymmetric offset parameters. These asymmetric designs are calculated to compensate for expected fabrication misalignments, ensuring that even when misalignment occurs, the overlap regions maintain balanced modulation efficiency across different optical arms. This asymmetric compensation approach improves reliability without requiring ultra-precise fabrication alignment.

Inventive Principle:
Principle #4Asymmetry

Data Source

PatentUS10823988B2Optical modulator robust to fabrication errors
Publication Date: 2020.11.03 CIENA CORP
  • US10823988B2 patent drawing
  • US10823988B2 patent drawing
  • US10823988B2 patent drawing

AI summary

An optical modulator includes a first arm and a second arm, each arm includes an arrangement with an equal amount of p-doped material and an equal amount of n-doped material, such that mask misalignment causes a same effect in both arms; and each arm includes a plurality of segments where electrodes connect for push-pull operation of the first arm and the second arm.