Optical Evaluation Apparatus for Combined MTF and Wavefront Measurement

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Solution Overview

Problem

Existing methods for evaluating optical performance of image pickup optical systems are limited in their ability to measure various optical systems with different specifications, requiring adjustments to the sensor and light source positions, and fail to comprehensively assess both on-axis and off-axis wavefront aberrations and modulation transfer functions (MTFs).

Innovation Solution

An optical apparatus and evaluation method using a first and second light source, a chart, and a light receiving system to measure on-axis transmitted wavefronts and off-axis MTFs, enabling comprehensive evaluation of optical performance by calculating frequency response characteristics and wavefront aberrations at different positions within the target optical system.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If a single evaluation method is used to measure optical performance, then measurement simplicity is improved, but measurement precision is worsened because only partial aberration information can be acquired

Engineering Contradiction:
Improvemeasurement simplicityVSAvoidaberration measurement precision
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The patent combines two different evaluation methods into a single integrated system: (1) MTF measurement using a chart with patterns illuminated by a first light source, and (2) wavefront aberration measurement using a second light source that forms a point image. Both measurements are performed simultaneously through the same optical system using a single light receiving system, achieving comprehensive optical performance evaluation without requiring separate measurement setups

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The light receiving system is designed to perform multiple functions: it can detect both the light transmitted through the chart patterns for MTF calculation and the light from the point image for wavefront aberration measurement. This multi-functional capability allows a single system to acquire complete optical performance data including both spatial frequency response and wavefront characteristics

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Adaptability or versatility

If the evaluation system is adapted to measure various optical systems with different specifications, then adaptability is improved, but device complexity worsens due to the need to change sensor and light source positions

Engineering Contradiction:
Improvecompatibility with various optical systemsVSAvoidsensor and light source positioning complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The evaluation system is designed with universal capability to measure different optical systems (telescopes, microscopes, cameras) without requiring physical reconfiguration. The system uses optical paths that can accommodate various optical systems by adjusting only the positional relationships between components, not the fundamental measurement methodology. This allows the same system to evaluate multiple optical systems with different specifications

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system adapts to different optical systems by changing measurement parameters rather than physical configuration. The evaluation can be performed by adjusting the relative positions and distances in the optical path according to the specific optical system being measured, while maintaining the same dual-method measurement approach. This parameter-based adaptation avoids complex mechanical reconfiguration

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Facilitates easy evaluation of optical performance across various optical systems, allowing for accurate measurement of on-axis wavefronts and off-axis MTFs, including aberration components like astigmatism, coma, and spherical aberration, without the need for sensor or light source repositioning.

Implementation Method 1

irradiating a chart including a plurality of patterns by using a first light source, receiving light having been emitted from the chart and transmitted through the target optical system

Methodology Applied
Scientific EffectLight transmission: Light

Implementation Method 2

shaping light emitted from a second light source different from the first light source to be a point image at a position different from the positions of the plurality of patterns

Methodology Applied
Scientific EffectLight shaping to point image: Focusing

Implementation Method 3

causing a wavefront sensor to receive light having been emitted from the point image and transmitted through the target optical system

Methodology Applied
Scientific EffectWavefront transmission: Light

Data Source

PatentUS12385804B2Optical apparatus, evaluation apparatus, evaluation method, and manufacturing method of optical system
Publication Date: 2025.08.12 CANON KK
  • US12385804B2 patent drawing
  • US12385804B2 patent drawing
  • US12385804B2 patent drawing

AI summary

An optical apparatus includes a first light source, a second light source, a chart, an optical system, and a light receiving system. The chart is configured to guide light emitted from the first light source to a target optical system. The optical system is configured to form a point image by using light emitted from the second light source. The light receiving system is configured to receive first light emitted from the chart via the target optical system and second light emitted from the point image via the target optical system. The first light and the second light enter different positions of the target optical system.