Optical Particle Detection in Additive Manufacturing Conduits
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Solution Overview
Problem
Conventional x-ray scanning methods for detecting excess particles in additive manufactured components are limited by machine accuracy and cost, particularly for components with complex geometries, and add unnecessary steps and time to the post-processing procedure.
Innovation Solution
A particle detection system comprising a conduit, sensors, and a particle analysis system that analyzes particle characteristics to determine if a component is substantially free of particles, using an emitter and sensor configuration to inspect particles within the conduit, enabling efficient detection and reducing the need for expensive x-ray scans.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If x-ray scanning is used to detect particles, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent extracts the particle detection function from the complex x-ray scanning system and implements it using a simple optical sensor and light source positioned adjacent to the conduit. This separates the detection capability from the expensive imaging equipment, achieving particle detection without requiring complex x-ray machinery.
Solution Approach 2:
The patent replaces expensive, complex x-ray scanning equipment with inexpensive optical sensors and light sources. These simple optical components can be easily replaced if needed, providing a cost-effective alternative to high-cost imaging systems while maintaining adequate detection capability for particle presence.
2Measurement precision
If x-ray scanning is used to detect particles, then measurement precision is improved, but loss of time increases
Solution Approach 1:
The patent performs particle detection during the cleaning process itself by positioning sensors adjacent to the conduit that receives particles from the cleaning system. This allows real-time detection while particles are being removed, eliminating the need for separate post-cleaning inspection steps and reducing overall processing time.
Solution Approach 2:
The patent skips the intermediate step of completing cleaning before inspection by implementing concurrent detection during the cleaning process. The optical sensors detect particles in real-time as they are being removed through the conduit, allowing the system to rush through the inspection phase without waiting for cleaning completion.
3Measurement precision
If x-ray scanning is used to detect particles, then measurement precision is improved, but ease of operation deteriorates
Solution Approach 1:
The patent implements a self-service detection system where the optical sensor automatically detects particles in the conduit without requiring operator intervention for calibration or operation. The system self-regulates by monitoring light transmission through the conduit and automatically determining particle presence, eliminating the need for trained operators to manage complex x-ray equipment.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system effectively determines the presence of particles, ensuring components are adequately cleaned and ready for implementation, reducing processing time and costs by providing a cost-effective and accurate method for particle detection.
Implementation Method 1
an emitter component positioned adjacent the inspection conduit. The emitter component may be configured to emit a signal through the inspection conduit. Additionally, the particle detection system may include a sensor positioned adjacent the inspection conduit, opposite the emitter component. The sensor may be configured to receive the signal emitted by the emitter component.
Data Source
AI summary
Particle detection systems are disclosed. The particle detection system may include a conduit configured to receive particles removed from a component, and at least one sensor positioned adjacent the conduit. The at least one sensor may be configured to detect a particle characteristic for the particles in the conduit removed from the component. The particle detection system may also include a particle analysis system in communication with the at least one sensor. The particle analysis system may be configured to analyze the particle characteristic for the particles in the conduit to determine if the component is substantially free of particles.