Optical Connector Pin Inspection With Feedback Process Control
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Solution Overview
Problem
Existing methods for inspecting the insertion state of pins or connectors into substrates are time-consuming, costly, and lack accuracy, leading to productivity issues due to errors in the insertion process caused by equipment settings, mechanical defects, and substrate non-planarity.
Innovation Solution
A substrate inspection apparatus that emits pattern light on the substrate to inspect the insertion state of pins, detects defects using image sensors and reference information, and adjusts process parameters of the connector insertion apparatus to improve insertion accuracy and reduce defects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If direct inspection of pin insertion state is performed, then insertion defects can be detected, but inspection time and cost increase significantly
Solution Approach 1:
The patent replaces direct mechanical inspection of pin insertion states with an optical measurement system. The apparatus uses a light source to project light onto the pin tails and an image sensor to capture the reflected light patterns, thereby detecting insertion states optically rather than through direct mechanical measurement, which reduces inspection time while maintaining detection accuracy
Solution Approach 2:
The patent creates an optical copy or image representation of the pin insertion state by capturing reflected light patterns. The image sensor records the optical pattern formed by light reflecting off pin tails at different heights, creating a visual copy of the insertion state that can be analyzed without direct physical measurement, thus speeding up the inspection process
2Manufacturing precision
If direct inspection and manual adjustment of insertion apparatus is performed, then insertion accuracy can be improved, but productivity deteriorates due to time-consuming manual intervention
Solution Approach 1:
The patent implements an automated feedback loop where the image sensor continuously monitors pin insertion states, the processor analyzes the optical patterns to detect deviations from proper insertion, and the system automatically adjusts insertion apparatus parameters based on the analysis results. This closed-loop feedback system maintains high insertion accuracy while eliminating time-consuming manual intervention, thereby preserving productivity
Solution Approach 2:
The inspection apparatus performs self-diagnosis and self-adjustment by automatically analyzing pin insertion states through optical patterns and generating control signals to adjust the insertion apparatus parameters. The system serves itself by detecting defects and correcting them without requiring external manual intervention, thus maintaining accuracy while maximizing productivity
3Reliability
If conventional inspection methods are used, then insertion defects can be detected, but measurement accuracy is insufficient
Solution Approach 1:
The patent replaces imprecise conventional mechanical or visual inspection methods with optical measurement technology. By using light reflection patterns from pin tails, the system achieves higher measurement precision in detecting insertion states, as optical methods can detect subtle height differences and positional variations that conventional methods miss, thereby improving both defect detection reliability and measurement accuracy
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The apparatus enables quick and accurate inspection of connector insertion states, efficiently controlling the insertion process to minimize defects and enhance productivity by adjusting parameters such as insertion force, position, and speed.
Implementation Method 1
emit pattern light on one surface of a first substrate into which a plurality of first connectors is inserted... receive the pattern light reflected from a pin tail of each of the plurality of pins
Data Source
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Figure 3A
AI summary
A substrate inspection apparatus may include: a communication circuit; a plurality of light sources; an image sensor; at least one memory; and at least one processor. The processor may be configured to: generate insertion state information indicating an insertion state of each of a plurality of pins included in each of a plurality of first connectors by using the pattern light reflected from the pin tail of each of the plurality of pins ; detect at least one second connector having an insertion defect by using the insertion reference information and the insertion state information of each of the plurality of pins; generate a control signal for adjusting at least one first process parameter, based on insertion state information for the plurality of pins included in the at least one second connector; and control the communication circuit to transmit the control signal to the connector insertion apparatus.