Optical Position Measuring Device with Tilted Detection Plane
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Solution Overview
Problem
Existing optical position measuring devices face complexity in transforming stripe patterns from scanning linear or angular scales into patterns suitable for different detector arrangements, often requiring additional optical elements and complicating miniaturization.
Innovation Solution
The optical position measuring device achieves this transformation by tilting the detection plane relative to the scale plane, eliminating the need for additional optical elements and allowing universal use of detector arrays or opto-ASICs for both linear and angular scales.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If additional optical elements (such as specially designed grids or microlens arrays) are introduced to transform stripe patterns, then the stripe pattern transformation capability is improved, but the device complexity and difficulty of miniaturization increase
Solution Approach 1:
The patent extracts and eliminates the additional optical elements (grids, microlens arrays) from the optical path, achieving stripe pattern transformation through the geometric arrangement of the detector array alone. This removes the source of complexity while preserving the transformation capability.
Solution Approach 2:
The detector array is designed with a curved arrangement that can handle multiple stripe pattern transformations (linear to curved, curved to linear, different curvature radii) without requiring different optical elements. This universal design eliminates the need for multiple specialized components.
2Adaptability or versatility
If additional optical elements are used to transform stripe patterns, then the transformation capability is improved, but the ease of miniaturization deteriorates
Solution Approach 1:
The patent removes additional optical elements from the system, leaving only the essential light source, scale, and detector array. This extraction of non-essential components directly enables miniaturization by reducing the number of elements that must be precisely positioned and aligned.
Solution Approach 2:
The patent changes the geometric parameters of the detector array (curved arrangement with specific radius of curvature) to achieve stripe pattern transformation. This parameter-based approach replaces complex optical transformations with simple geometric configuration, facilitating miniaturization.
3Measurement precision
If different detector arrangements are designed for different scale types (linear vs. angular), then the measurement precision is improved, but the device complexity and adaptability worsen
Solution Approach 1:
The patent designs a universal curved detector array that can measure both linear and angular scales with high precision. The curved geometry naturally adapts to different scale types and curvature radii, eliminating the need for different detector designs while maintaining measurement accuracy.
Solution Approach 2:
The detector array's curved geometry provides dynamic adaptability to different measurement scenarios. By adjusting the radius of curvature of the detector array to match the scale being measured, the system maintains optimal measurement precision across different applications without requiring physical redesign.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach simplifies the transformation process, enables the use of existing detector arrays for various scales, and does not require additional optical components, thereby enhancing system miniaturization and adaptability.
Implementation Method 1
A light source and a detector arrangement are provided on the scanning unit side
Implementation Method 2
a detector arrangement which extends along a curved array direction... and is converted into displacement-dependent position signals via the detector arrangement
Data Source
AI summary
The invention relates to an optical position measuring device which is used to determine the relative position of a sampling unit and a material measure which can be displaced at least in one measuring direction and which is arranged on the material measure plane. Said material measure extends along a first straight line or a curved line. Said sampling unit comprises a light source and a detector arrangement which extends along a second line and which is arranged on a detection plane, said curve being different from the first straight line or the first curved line. A stripe pattern resulting in the sampling of the material measure transforms into a stripe pattern extending along the second line. The material measure plane and the detection plane are not parallel to each other for transformation.