Optical Probe Pin Sensing for Precise DUT Alignment

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Solution Overview

Problem

The alignment of optical probes with light transmission devices in device under test (DUT) is typically manual, leading to imprecise control and inaccurate testing results.

Innovation Solution

A probe device and system that utilize a sensing module with multiple pins to adjust relative orientations and positions between the optical probe and a reference region, enabling precise alignment through automated rotation and movement controlled by computing devices and motors.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If manual alignment is used to position optical probes with light transmission devices, then the operation is simple and quick, but the alignment precision is poor leading to inaccurate testing results

Engineering Contradiction:
Improvealignment precisionVSAvoidalignment system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces manual mechanical alignment with an automated sensing system that uses electrical contacts (pins) to detect and control the optical probe's position. The sensing module with multiple pins automatically determines alignment status, eliminating the need for manual adjustment while achieving precise alignment through automated feedback control.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The sensing module provides real-time feedback about the optical probe's position and alignment status through electrical contact detection. This feedback enables the system to automatically adjust and control the alignment process, ensuring precise positioning without manual intervention by continuously monitoring whether the pins are in contact with the reference region.

Inventive Principle:
Principle #23Feedback

2Measurement precision

If automated alignment with multiple pins is implemented, then alignment precision is improved, but the device complexity and number of components increase

Engineering Contradiction:
Improvealignment precisionVSAvoidsensing module complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The alignment control is divided into multiple independent sensing pins that can individually detect contact with the reference region. Each pin functions as an independent sensing element, allowing the system to achieve precise multi-dimensional alignment through the combined information from several simple, identical components rather than one complex sensing mechanism.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The sensing pins serve multiple functions: they detect alignment status, provide positioning feedback, and control the alignment process. By using the same simple pin structure for all these functions, the patent avoids the need for separate complex components for each function, thereby reducing overall device complexity while maintaining high precision.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Reliability

If manual alignment operation is used, then the operation process is simple, but the testing accuracy is poor due to uncontrollable alignment precision

Engineering Contradiction:
Improvetesting accuracyVSAvoidalignment operation ease
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The alignment system performs self-alignment through automated sensing and control. The sensing module automatically detects when the optical probe is properly positioned by monitoring pin contact with the reference region, eliminating the need for manual adjustment operations. This self-service capability ensures consistent, reliable alignment results while simplifying the overall operation to a single automated process.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS12625164B2Probe device, probe system including the probe device and operating method thereof
Publication Date: 2026.05.12 STAR TECHNOLOGIES INC
  • US12625164B2 patent drawing
  • US12625164B2 patent drawing
  • US12625164B2 patent drawing

AI summary

The present disclosure provides a probe device, a probe system including the probe device and an operating thereof. The operating method includes: approaching the probe device to a reference region; stopping the probe device when a first pin of a sensing module of the probe device touches the reference region; rotating the probe device and approaching the probe device to the reference region; and stopping the probe device when both the first pin and a second pin of the sensing module of the probe device touch the reference region.