Interchangeable Optical Probe Tips for Accurate Shape Measurement
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Solution Overview
Problem
Existing shape measuring devices face challenges in achieving high accuracy for both contact and non-contact measurements, particularly when measuring objects with low surface roughness or complex shapes, due to deflection errors and sensitivity issues with conventional probes.
Innovation Solution
A probe design that incorporates both non-contact and contact measurement capabilities, utilizing a light incidence/emission portion, optical splitting elements, and interchangeable tip portions with retroreflective elements, allowing for selective measurement methods based on the object's surface characteristics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a contact measurement probe is used, then measurement precision can be maintained for objects with low surface roughness, but deflection errors occur and device complexity increases due to the fulcrum portion
Solution Approach 1:
The patent replaces the mechanical contact measurement system with an optical non-contact measurement system. The optical probe uses a light source and photodetector to measure object surfaces without physical contact, eliminating deflection errors and the need for complex fulcrum portions while maintaining measurement precision for objects with low surface roughness
Solution Approach 2:
The patent introduces an optical intermediary (light) to transfer measurement information from the object surface to the detector. This optical intermediary enables non-contact measurement, avoiding the mechanical contact issues that cause deflection errors and device complexity
2Device complexity
If a non-contact optical probe is used, then deflection errors are eliminated, but sensitivity becomes unstable when measuring objects with low surface roughness
Solution Approach 1:
The patent changes the measurement parameter from optical reflectance (which is unstable for low surface roughness) to optical interference patterns. By measuring interference fringes formed by reflected light, the system achieves stable and sensitive detection even for objects with low surface roughness, resolving the reliability issue of non-contact probes
3Adaptability or versatility
If a contact measurement probe is used, then measurement can be performed on all object types, but radius correction errors occur for fine edge shapes and free curved surfaces
Solution Approach 1:
The patent replaces mechanical contact measurement with optical non-contact measurement, eliminating the probing sphere that causes radius correction errors. The optical method directly measures the object surface geometry without the influence of the measurement probe's own dimensions, achieving high precision for fine edge shapes and free curved surfaces while maintaining versatility
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables high-accuracy shape measurement regardless of the object's type, reducing component count and cost while maintaining precision through rotational scanning and interference signal detection.
Implementation Method 1
an optical splitting element including a first surface, a second surface, and a third surface, the optical splitting element configured to: split the measuring light incident on the first surface from the light incidence/emission portion and emit a portion of the measuring light from the second surface
Implementation Method 2
a retroreflective element configured to retroreflect the measuring light incident from the second surface through an inside of the second shaft and return the reflected light toward the second surface
Implementation Method 3
a light-receiving element configured to receive the reflected light emitted from the third surface
Data Source
AI summary
A probe includes: a light incidence/emission portion (cable tip surface) that emits measuring light and receive its reflected light; an optical splitting element (beam splitter) including a first surface a second surface, and a third surface, the optical splitting element (beam splitter) optically splitting the measuring light incident on the first surface from the light incidence/emission portion so as to emit a portion thereof from the second surface, optically splitting the reflected light incident on the second surface so as to emit a portion thereof from the first surface toward the light incidence/emission portion and to emit a remaining portion from the third surface; a light-receiving element that receives the reflected light emitted from the third surface; and a tip portion mounting portion (mounting shaft) that selectively mount either a first probe tip portion for non-contact measurement or a second probe tip portion for contact measurement.