Optical Profilometer Color Imaging Depth-of-Field
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Solution Overview
Problem
There is a need for optical instrumentation capable of generating data representing both the surface profile and color image of a sample, which existing technologies have not adequately addressed in terms of depth-of-field and color imaging.
Innovation Solution
The development of electro-optical systems that include a light source configured to output light of multiple colors, an optical objective to couple and direct light to a sample, and a controller to automatically control the color and vertical position of the objective, along with a detector to output data representing a surface profile and color images, utilizing techniques such as vertical scanning interferometry, confocal microscopy, and focus variation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional optical instrumentation is used for surface profiling, then depth-of-field is limited, but system complexity remains manageable
Solution Approach 1:
The patent combines surface profiling and color imaging functions into a single optical system. The detector captures both interference fringe data for surface topography and color information simultaneously, eliminating the need for separate instrumentation and thereby improving depth-of-field while managing system complexity through functional integration.
Solution Approach 2:
The optical system is designed to perform multiple functions: it captures interference patterns for surface profiling, records color information through the detector, and generates both topographic maps and color images from a single measurement setup. This multi-functionality resolves the contradiction by achieving enhanced depth-of-field without proportionally increasing system complexity.
2Measurement precision
If separate instruments are used for surface profiling and color imaging, then individual function performance is optimized, but overall system complexity increases
Solution Approach 1:
The patent merges surface profiling and color imaging into a single integrated system. The detector simultaneously captures interference fringe patterns for topography and color information, producing both surface profile data and color images from one measurement, thereby maintaining measurement precision while reducing instrumentation complexity.
Solution Approach 2:
The system achieves universality by using a single optical path and detector to perform both surface profiling and color imaging. The controller processes the detector output to generate both topographic maps and color images, eliminating the need for separate instruments and reducing overall system complexity while preserving the precision of surface profile measurements.
3Adaptability or versatility
If multiple detectors are used for simultaneous surface profiling and color imaging, then measurement capability is enhanced, but device complexity and cost increase
Solution Approach 1:
The patent employs a single detector that serves dual purposes: capturing interference fringe patterns for surface profiling and recording color information. The controller processes this single detector's output to generate both topographic maps and color images, thereby achieving adaptability for dual measurement capabilities without increasing detector system complexity.
Solution Approach 2:
The system achieves dual measurement capability by utilizing different parameters from the same detector output. The controller analyzes specific characteristics of the detected light (interference patterns versus color intensity) to extract both surface topography and color information, demonstrating how parameter changes in data processing can provide versatility without hardware complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
These systems provide high-resolution, non-contact surface profiling and color imaging with improved depth-of-field and reduced system complexity, enabling accurate measurement of surface topography and color representation.
Implementation Method 1
an optical objective configured to couple the output light from the light source to a sample under measurement when present, and direct reflected light from the sample
Implementation Method 2
utilizing techniques such as vertical scanning interferometry, confocal microscopy, and focus variation
Implementation Method 3
a detector configured to receive the reflected light and to detect focus, and output data representing a surface profile of the sample
Implementation Method 4
a light source configured to selectively output light... The color of the light is selected from multiple colors
Data Source
AI summary
A system includes a light source configured to selectively output light. An optical objective is configured to couple the output light from the light source to a sample under measurement when present, and direct reflected light from the sample. A controller is configured to automatically control a color of the output light and a vertical position of the optical objective relative to the sample. The color of the light is selected from multiple colors. The vertical position includes a range of vertical positions scanned by the objective. A detector is configured to receive the reflected light and to detect focus, and output data representing a surface profile of the sample. The output data includes color images of the surface profile.