3D Optical Property Estimation With Multi-Wavelength Wavefronts

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Solution Overview

Problem

Existing methods struggle to reconstruct objects with large thicknesses with high accuracy and high spatial resolution due to limitations in wave front information acquisition.

Innovation Solution

An estimation system and method that utilizes both first and second wave front information, obtained from illumination light with different wavelengths, to estimate three-dimensional optical properties such as refractive index distribution or absorbance distribution, by varying the wavelength and angle of incidence to increase the amount of wave front information.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If single-wavelength illumination is used for object reconstruction, then the reconstruction process is simple, but the measurement precision and spatial resolution are insufficient for thick objects

Engineering Contradiction:
Improvemeasurement precisionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies parameter changes by utilizing multiple wavelengths of illumination light instead of a single wavelength. The controller varies the wavelength parameter of the light source to acquire wave front information at different wavelengths, which enhances the measurement precision for thick objects while managing the increased system complexity through automated wavelength switching.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If multiple wavelengths are used to improve measurement precision, then the accuracy of three-dimensional optical property determination increases, but the device complexity and measurement time increase

Engineering Contradiction:
ImproveaccuracyVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent implements periodic action by sequentially switching between multiple wavelengths in a systematic manner. The controller periodically changes the wavelength parameter to acquire wave front information at each wavelength, then processes all collected data together. This structured periodic approach improves accuracy through multi-wavelength data while managing measurement time through efficient sequential acquisition and parallel processing capabilities.

Inventive Principle:
Principle #19Periodic action

Data Source

PatentUS12449357B2Estimation system, estimation method, and recording medium
Publication Date: 2025.10.21 EVIDENT CORP
  • US12449357B2 patent drawing
  • US12449357B2 patent drawing
  • US12449357B2 patent drawing

AI summary

An estimation system has a memory and a processor. The memory stores first wave front information and second wave front information. The first wave front information is information on the wave front that is obtained based on first illumination light that has passed through an object. The second wave front information is information on the wave front that is obtained based on second illumination light that has passed through the object. The wavelength at which the intensity of the second illumination light is highest is shorter than the wavelength at which the intensity of the first illumination light is highest. The processor performs an estimation process of estimating a three-dimensional optical property of the object. The three-dimensional optical property is a refractive index distribution or an absorbance distribution. The estimation process uses both the first wave front information and the second wave front information.