Optical Quality Control Device for High Refractive Index Solids
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Solution Overview
Problem
Current optical quality control systems for high refractive index translucent or transparent solids are inefficient in detecting defects due to limitations in spatial resolution, accuracy, and cost-effectiveness, particularly in three-dimensional scanning and maintenance, and often miss areas within the solid during inspection.
Innovation Solution
An optical quality control system utilizing a container filled with a high refractive index liquid, a structured light source projecting a planar light fan through the solid to generate an illuminated cross-section, allowing for precise inspection of defects across the entire solid surface, with multiple light sources at different angles and lenses to enhance defect visibility, and a light source transport system for comprehensive scanning.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a focused laser beam is used to scan the precious stone point by point, then the spatial resolution and defect detection accuracy are improved, but the inspection time and device complexity increase significantly
Solution Approach 1:
The patent transitions from point-by-point scanning in two dimensions to planar cross-section illumination in three dimensions. By projecting a planar light fan that illuminates an entire cross-section of the solid simultaneously, the system achieves comprehensive defect detection without sequential scanning, thereby improving inspection speed while maintaining detection accuracy.
Solution Approach 2:
The patent creates an optical copy or image of the internal cross-section of the solid by projecting light through it and capturing the transmitted or scattered light patterns. This allows simultaneous visualization of the entire cross-sectional area rather than requiring physical movement through each point, resolving the contradiction between detailed inspection and speed.
2Reliability
If a spiral scanning trajectory is used to cover the entire precious stone, then comprehensive defect coverage is improved, but the inspection time and risk of missing areas increase
Solution Approach 1:
The patent employs multiple light sources arranged at different angular positions around the solid, each projecting a planar light fan through a different cross-section. This multi-dimensional approach ensures complete defect coverage by illuminating the solid from multiple angles simultaneously, eliminating the need for sequential spiral scanning and reducing inspection time.
Solution Approach 2:
The patent combines multiple light sources and their corresponding illumination paths into a single integrated inspection system. By merging the functionality of multiple scanning trajectories into simultaneous multi-angle cross-section illumination, the system achieves comprehensive defect detection without the time loss associated with sequential scanning.
3Measurement precision
If the photosensitive device is exposed and arranged within the liquid for direct measurement, then the measurement capability is improved, but the device reliability and maintenance cost worsen due to chemical exposure
Solution Approach 1:
The patent introduces the high refractive index liquid as an intermediary medium between the light sources and the solid being inspected. The liquid serves multiple functions: it enhances light transmission by matching refractive indices, reduces surface reflections, and protects the external photosensitive devices from direct exposure to harsh environments, thereby maintaining measurement precision while improving device reliability.
Solution Approach 2:
The patent creates an optical image or copy of the internal defect structure by transmitting light through the solid and capturing the light patterns on the opposite side. This indirect imaging approach allows defect detection without requiring the photosensitive device to be physically exposed to the liquid or positioned within the harsh inspection environment, thus protecting the device while maintaining detection capability.
4Measurement precision
If multiple scans in different directions are performed to determine three-dimensional defect position, then the spatial localization accuracy is improved, but the inspection time and productivity decrease
Solution Approach 1:
The patent uses multiple light sources positioned at different angular locations, each projecting a planar light fan through a different cross-sectional plane of the solid. By simultaneously capturing images from multiple angles and combining them with knowledge of the light source positions, the system directly determines three-dimensional defect locations in a single inspection operation, achieving both high spatial accuracy and high productivity.
Solution Approach 2:
The patent employs a control system that processes images from multiple light sources and uses the known geometric relationships between light sources and the solid to calculate precise three-dimensional defect positions. This feedback-based computational approach enables simultaneous multi-angle inspection with accurate spatial localization, eliminating the need for sequential scanning while maintaining measurement precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid, accurate, and economical detection of defects within high refractive index solids, improving spatial resolution and reducing maintenance costs by providing a systematic and fast inspection method that covers the entire cross-section of the solid.
Implementation Method 1
the high refractive index liquid reduces the reflection from the outer surfaces of the stone and the refractive bending and separation of the light when it enters the precious stone
Implementation Method 2
the high refractive index liquid reduces the reflection from the outer surfaces of the stone
Implementation Method 3
A structured light source or multiple structured light sources is configured to project a planar light fan through the high refractive index translucent solid fully or at least partially immersed in the high refractive index liquid generating an illuminated cross-section in the solid
Implementation Method 4
when the laser beam hits a bubble or inclusion it is dispersed and the intensity of the laser light passing straight through the stone will be reduced
Data Source
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AI summary
Optical quality control system for controlling the quality of a high refractive index solid (2), comprising a container (4) configured to receive the solid therein, a structured light source (30), an optical inspection zone configured for receiving an optical device (10) or an eye of a human observer, and a high refractive index liquid (12) for insertion in the container in a volume sufficient to fully immerse the translucent solid. The structured light source is configured to project a planar light fan (20) through the high refractive index solid immersed in the high refractive index liquid generating a illuminated cross- section (18) in the solid. The optical inspection zone is arranged at a top end of the container adapted for inspection of the illuminated cross-section in a direction transverse to a plane (P) defined by the planar illuminated cross-section.