Non-contact Module Positioning via Optical Scattering and Photogrammetry
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Solution Overview
Problem
Existing photogrammetry methods require physical contact or visualization of objects to measure their location and orientation, limiting their application in manufacturing and other environments where direct measurement is not feasible.
Innovation Solution
A system combining optical scattering and photogrammetry using an optical generator, diffractive element, and digital cameras to generate and analyze optical patterns, allowing for non-contact, remote measurement of object location and orientation by processing optical coordinate data with photogrammetry software and minimization algorithms.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional photogrammetry methods are used to measure object location and orientation, then measurement precision can be achieved, but physical contact or direct visualization of the object is required which limits application in hostile environments and manufacturing processes
Solution Approach 1:
The patent introduces an optical scattering medium as an intermediary between the measurement system and the object. Instead of directly measuring the object, the system measures how the object scatters optical patterns, enabling non-contact measurement in hostile environments while maintaining precision
Solution Approach 2:
The patent replaces traditional mechanical contact measurement systems with an optical-based measurement system. By using optical pattern projection and scattering analysis, the system eliminates the need for physical contact or direct visualization, enabling measurement in environments where traditional methods cannot operate
2Measurement precision
If optical targets are placed on objects for measurement, then location determination can be achieved, but the system becomes more complex and requires physical modification of the object
Solution Approach 1:
The patent enables the object itself to serve as the measurement target by utilizing its natural optical scattering properties. The object's interaction with projected optical patterns provides sufficient information for location and orientation determination without requiring additional targets or markers
Solution Approach 2:
The patent changes the measurement parameter from direct geometric observation to optical scattering analysis. By analyzing how optical patterns scatter when interacting with the object, the system extracts location and orientation information without requiring physical targets, thereby simplifying the overall system
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables inexpensive, non-contact, and precise measurement of object position and orientation with low uncertainty, suitable for large translations and rotations, and applicable in hostile environments, improving manufacturing processes and metrology precision.
Implementation Method 1
a diffractive element placed in the path of the optical beam which generates an optical pattern
Implementation Method 2
an optical generator which generates an optical beam
Implementation Method 3
a plurality of digital cameras connected to a computer with photogrammetry software
Data Source
AI summary
A system for determining the position and location of a module comprising: a module which includes an optical generator which generates an optical beam; a diffractive element placed in the path of the optical beam which generates an optical pattern; a reference length artifact placed in a location with close proximity to the optical pattern; and a plurality of digital cameras connected to a computer with photogrammetry software and a minimization algorithm installed on the computer; where the digital cameras are set up in different locations to take one or more digital images of the optical pattern, with at least one digital image including the reference length artifact; and where the digital images are downloaded onto the computer and processed by the photogrammetry software to generate optical coordinate data followed by the insertion of the optical coordinate data into the minimization algorithm to generate the position and location of the module.