Optical Sectioning via Spectral Multiplexing
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Solution Overview
Problem
Existing methods for generating optical sectional images require multiple steps and mechanical adjustments, leading to inaccuracies, high costs, and limitations in applications like microscopy, particularly when dealing with changing wavelengths or weak light signals.
Innovation Solution
A device that projects and records only two illumination patterns, eliminating the need for precise alignment of the illumination structure with the detector and allowing for faster, more robust scanning with improved signal-to-noise ratio, and enabling axial chromatic correction without mechanical elements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple illumination patterns are projected and recorded to generate optical sectional images, then measurement precision is improved, but loss of time increases due to multiple steps
Solution Approach 1:
The illumination pattern is segmented into multiple wavelength components that are projected simultaneously onto the sample. Each wavelength component carries different phase information, allowing the system to extract optical sectioning data from multiple virtual patterns in a single exposure, thereby reducing the number of sequential steps required
Solution Approach 2:
The patent transitions from temporal multiplexing (sequential projection of patterns) to spectral multiplexing (simultaneous projection of multiple wavelengths). By adding the spectral dimension, the system encodes multiple illumination patterns across different wavelengths that can be captured simultaneously and later decoded to retrieve optical sectioning information
2Adaptability or versatility
If mechanical elements are used to adjust the position of the projected structure, then adaptability is improved, but reliability deteriorates due to positioning inaccuracies and artifacts
Solution Approach 1:
The patent replaces mechanical positioning systems with a computational approach. Instead of physically moving the illumination structure to different positions, the system projects multiple wavelength patterns simultaneously and uses digital processing to simulate the effect of positional variations. This eliminates mechanical artifacts and positioning inaccuracies while maintaining full adaptability through software control
3Measurement precision
If bandpass filters are used to transmit specific wavelength ranges, then measurement precision is improved for color discrimination, but loss of information increases due to opacity of other wavelengths
Solution Approach 1:
The patent employs a分光棱镜 (spectral beam splitter) that simultaneously directs multiple wavelength ranges to different detection channels. This universal optical element handles all spectral components in a single pass, eliminating the need for sequential bandpass filtering and preventing information loss that would occur with opaque filters blocking non-target wavelengths
4Measurement precision
If precise alignment of illumination structure with detector is implemented, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent implements self-alignment through the optical design itself. The illumination patterns are projected through the same optical path as the detection system, and the wavelength-based encoding scheme inherently references the optical axis. This self-referential design automatically ensures proper alignment without requiring external adjustment mechanisms or complex alignment procedures
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables faster and more accurate generation of optical sectional images with reduced mechanical complexity, improved robustness, and enhanced signal quality, suitable for various applications including microscopy and fluorescence microscopy.
Implementation Method 1
The light distributions projected into or onto the object are scattered, reflected, transmitted by it, absorbed or stimulate fluorescence or luminescence
Implementation Method 2
Here a structure, for example a grid, is projected into the sample to be imaged. This creates a modulation of the light distribution in the sample
Implementation Method 3
The light distributions projected into or onto the object are scattered, reflected, transmitted by it, absorbed or stimulate fluorescence or luminescence
Data Source
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AI summary
The invention relates to a method and an assembly for generating optical split images. The invention permits the three-dimensional, layered optical scanning of spatially extended objects (10) and is used in microscopy, but is not limited to this field. In said method, periodically distributed exposures (3) are projected in one spatial direction into a plane (9) and fluorescent and/or luminescent light that is reflected and/or scattered and/or emitted by the sample (10) is reproduced on a local-resolution detector (11). According to the invention, a calibration step is first carried out, in which step the local phase and/or the local period of the distributed exposures are determined for each location on the detector (11). In the sample detection mode, two distributed exposures are projected into or onto the sample (10) to calculate each split image and the resultant intensity distributions are reproduced on the detector (11). The method steps for projecting and detecting two exposure light distributions are repeated as often as desired, in particular for different focal positions of the sample (10) and/or different exposure wavelengths and the intensity distributions are used to calculate at least one optical split image from the captured intensity distributions with the aid of the local phase and/or local period.