Optical Sensor Built-In Test for Quality Detection
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Solution Overview
Problem
Optical sensors are sensitive to external optical disturbances and internal failures, which can degrade image quality without a reliable method to distinguish between the two.
Innovation Solution
A built-in test system using a processing unit with built-in and relative built-in test modules to analyze image frames, employing Fast Fourier Transform and high pass filters to detect reductions in optical quality and differentiate between external disturbances and sensor failures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If image frames are stored for analysis to detect optical quality reductions, then measurement precision is improved, but storage requirements increase
Solution Approach 1:
The patent extracts only the essential information from image frames by applying Fast Fourier Transform and high pass filters to detect optical quality reductions. Instead of storing complete image frames, the system extracts and stores only the transformed data and feature parameters, significantly reducing storage requirements while maintaining detection accuracy.
Solution Approach 2:
The system performs preliminary processing of image frames through Fast Fourier Transform and high pass filtering before storage and analysis. This preliminary action transforms the data into a compressed representation that captures optical quality information while reducing the amount of data that needs to be stored and processed later.
2Measurement precision
If complex analysis methods are used to distinguish between external disturbances and sensor failures, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent replaces complex computational analysis methods with more efficient mathematical transformations. Specifically, it uses Fast Fourier Transform and high pass filters to convert image data into the frequency domain, where optical quality reductions become more easily detectable through simple threshold comparisons, reducing overall system complexity.
Solution Approach 2:
The system changes the parameter space by transforming image frames from the spatial domain to the frequency domain using Fast Fourier Transform. This parameter transformation simplifies the detection process, as optical quality reductions manifest as specific patterns in the frequency domain that can be detected through straightforward analysis rather than complex algorithms.
3Productivity
If real-time analysis is performed to maintain operational functionality, then productivity is improved, but computational resources increase
Solution Approach 1:
The patent replaces computationally intensive image processing algorithms with efficient Fast Fourier Transform and high pass filtering operations. These mathematical transformations are computationally lighter than traditional image analysis methods, enabling real-time processing while reducing the computational resources required.
Solution Approach 2:
The system extracts only the necessary information from image frames for optical quality assessment by applying Fast Fourier Transform and high pass filters. This extraction approach processes only the essential features needed for detection, reducing computational load while maintaining real-time capability.
Data Source
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AI summary
An optical system including one or more optical sensors and a processing unit capable of performing built-int tests of the optical sensor(s) and methods thereof are disclosed. The processing unit includes a built-in test module configured to detect a reduction of an optical quality of at least some of the images generated by at least one of the optical sensors with respect to an expected optical quality thereof. The built-in test module may be configured to determine whether the reduction of the optical quality thereof is due to the "external optical disturbances" (EOD) and/or failure of the optical sensor(s)/system. The processing unit may include a relative built-in test module configured to compare at least some images generated by at least two of the optical sensor(s) and to determine which of the at least two optical sensors thereof, if any, is subjected to at least one of the EOD and/or failure.