Optical Sensor Chip Calibration via Unique ID and Response Data

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Solution Overview

Problem

Optical sensor data accuracy is compromised due to the complexity of calibration processes, which often require application-specific parameters and methods, and existing calibration routines may not adequately account for variations in production and material properties, leading to inconsistent sensor performance across different environments and applications.

Innovation Solution

An improved method for characterizing and calibrating optical sensor chips involves assigning a unique chip ID, recording sensor response data in a standardized environment, and providing a tailored calibration algorithm associated with the chip ID, allowing for precise calibration and compensation of sensor data across varying temperatures and applications.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If calibration routines are applied to achieve calibrated sensor data, then sensor data accuracy is improved, but calibration process complexity increases and requires application-specific parameters

Engineering Contradiction:
Improvesensor data accuracyVSAvoidcalibration process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by performing calibration measurements and characterizing sensor response during the manufacturing process itself, rather than requiring separate calibration steps later. The system records sensor response data under controlled conditions at the production line and stores it associated with the chip ID, enabling the sensor to be calibrated without complex application-specific calibration routines being needed by the end user.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If existing calibration routines are used, then calibration can be performed, but they do not adequately account for variations in production and material properties

Engineering Contradiction:
Improvesensor performance consistencyVSAvoidcalibration accuracy
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The patent applies local quality by characterizing each individual sensor chip's response uniquely based on its specific production variations and material properties. Instead of using a generic calibration routine, the system measures and stores individual sensor response data for each chip (referenced by chip ID), allowing the calibration to account for local variations in that specific chip's performance characteristics.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent applies parameter changes by dynamically adjusting calibration parameters based on measured sensor response characteristics. The system determines calibration parameters by analyzing the actual sensor response data obtained during manufacturing, and these parameters are then used to compensate for variations in production and material properties, ensuring consistent and accurate sensor performance across different chips.

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If application-specific calibration parameters are required, then calibration accuracy can be optimized, but device complexity and operational difficulty increase

Engineering Contradiction:
Improvecalibration accuracyVSAvoidcalibration operation simplicity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent applies self-service by enabling the sensor chip to provide its own calibration information through its uniquely identified sensor response data stored during manufacturing. The chip ID serves as a key to retrieve the specific calibration data for that chip, allowing the system to automatically access and apply the correct calibration parameters without requiring manual intervention or complex user-configured calibration routines.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS12196614B2Method of characterizing an optical sensor chip, method of calibrating an optical sensor chip, method of operating an optical sensor device, optical sensor device and calibration system
Publication Date: 2025.01.14 AMS SENSORS GERMANY GMBH
  • US12196614B2 patent drawing
  • US12196614B2 patent drawing
  • US12196614B2 patent drawing

AI summary

Disclosed are methods and devices for calibration in the field of optical sensors, e.g. characterizing and calibrating an optical sensor chip. In order to address complexity of sensor data with high accuracy the optical sensor, e.g. an optical sensor is not provided as an already calibrated unit. Rather, sensor response data may be recorded in a defined or standardized environment, e.g. at a production line, and with high precision. This high standard sensor response data can be obtained on a per device basis and, thus, is referenced with an unambiguous chip identification number, chip ID. The sensor data is complemented with a dedicated calibration algorithm which can be tailor-made to fit the optical sensor or the optical sensor chip. In order to retrieve the sensor response data and the calibration algorithm both can be made available by means of the chip ID, for example.