Data Throttling for Optical Sensor Wafer Testing
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Solution Overview
Problem
High-speed image processing equipment poses challenges during testing and analysis, particularly in wafer probe tests, due to non-ideal impedance matching of differential data paths, leading to reduced reliable data sampling and increased power consumption with high-definition video demands.
Innovation Solution
A system that interfaces high-speed optical sensor equipment with lower-speed testing equipment by throttling the data stream at a serial interface, subdividing pixel data, and outputting subsets with an offset, allowing full-speed operation of the sensor while enabling slower testing equipment to perform data analytics, thereby facilitating quality control without requiring matching speed capabilities.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If high-speed image processing equipment is used to meet high-definition video demands, then image quality and resolution are improved, but power consumption increases and reliable data sampling is reduced due to non-ideal impedance matching
Solution Approach 1:
The patent segments the high-speed data stream into multiple lower-speed data lanes. The optical sensor operates at full high-speed capacity to maintain image quality, while the data is divided into multiple parallel lower-speed streams for transmission to testing equipment, reducing power consumption and impedance matching requirements.
Solution Approach 2:
The patent transforms the single high-speed data path into multiple parallel lower-speed data paths by adding a temporal dimension to data transmission. Data from different pixel rows or columns is transmitted in sequential time slots over multiple lanes, converting a spatial bandwidth problem into a temporal multiplexing solution.
2Productivity
If high-speed optical sensor equipment operates at full speed, then data capture capability is improved, but compatibility with lower-speed testing equipment is reduced
Solution Approach 1:
The patent introduces a data serialization and throttling intermediary layer between the high-speed optical sensor and lower-speed testing equipment. This intermediary captures full-speed data from the sensor, buffers and resequences it, then outputs at compatible lower speeds, enabling both high productivity and broad adaptability.
Solution Approach 2:
The patent implements dynamic speed adaptation where the data output rate is adjustably throttled based on the capabilities of the connected testing equipment. The system maintains full-speed data capture internally while dynamically adjusting the output data rate to match various testing equipment speed requirements.
3Speed
If data is transmitted at full speed from the optical sensor, then processing speed is improved, but data sampling reliability is reduced due to impedance matching issues
Solution Approach 1:
The patent segments the high-speed data stream into multiple lower-speed parallel streams, reducing the bandwidth requirement for each individual transmission channel. This segmentation lowers the impedance matching demands on each data lane while maintaining overall high processing throughput through parallel processing.
Solution Approach 2:
The patent changes the transmission parameters by reducing the data rate on each individual lane while increasing the number of parallel lanes. This parameter transformation maintains total data throughput while improving signal integrity and sampling reliability on each lane by operating at lower, more stable speeds.
Data Source
AI summary
Providing for operation of high-speed optical sensor equipment at full data path speeds in conjunction with testing equipment operating at a lower speed is described herein. By way of example, a data stream output from optical sensor equipment to testing equipment can be throttled at a serial interface between such equipment. Throttling can involve subdividing a set of pixel data and outputting a subset of the pixel data in a given readout frame. Consecutive outputs of respective subsets of pixel data are initiated with an offset from the previous readout frame. Accordingly, the optical sensor equipment can be operated at full speeds, simulating realistic operational conditions, while slower testing equipment can be utilized to perform data analytics, heuristics, and other quality tests on various portions of the optical sensor equipment.