Optical Shape Measurement Device Region Control
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Solution Overview
Problem
Shape measurement devices face challenges in measuring complex shapes efficiently, as contact-based methods are time-consuming, and non-contact methods like the light-section method require complex setup and operations.
Innovation Solution
A shape measurement device that projects a line-shaped or spot pattern onto an object using a projection optical system and captures images with an image capturing device, while rotating the object and probe relative to each other, allowing for the setting of measurement regions and controlling movement mechanisms based on the pattern's positional relationship with the rotation axis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a contact sensor is used to measure the surface shape, then measurement accuracy is maintained, but the measurement time increases and the number of measurement points cannot be increased
Solution Approach 1:
The patent replaces the contact sensor-based mechanical measurement system with a non-contact optical measurement system using light-section method. The projection optical system projects light patterns onto the measurement target surface, and the image capturing device captures the deformed light patterns to calculate surface shape, eliminating the need for physical contact and significantly reducing measurement time.
Solution Approach 2:
The patent creates an optical copy of the measurement target surface by projecting light patterns and capturing their deformation. Instead of physically touching and measuring each point with a contact sensor, the system uses light to create a visual representation of the surface shape, which is then analyzed to obtain precise measurements without contact.
2Productivity
If a light-section method is used for non-contact measurement, then measurement speed increases, but the operational complexity and setup conditions increase
Solution Approach 1:
The patent creates a measurement system that can handle various measurement targets and conditions through a unified approach. The projection optical system and image capturing device can measure different types of surfaces (reflective, absorptive, transparent, translucent) by adjusting measurement conditions, making the system versatile and easier to operate across multiple applications.
Solution Approach 2:
The patent adjusts measurement parameters such as light pattern type, projection angle, and image capture settings based on the specific measurement target properties. By changing these parameters rather than requiring complex manual setup for each target type, the system maintains high measurement speed while reducing operational complexity.
3Measurement precision
If the measurement region is expanded to cover the entire object, then completeness of measurement is improved, but the measurement time and data processing complexity increase
Solution Approach 1:
The patent divides the measurement process into multiple regions (first measurement region and second measurement region) that are measured sequentially. The projection optical system and image capturing device measure one region, then move to the next region, allowing comprehensive coverage of the entire measurement target while managing measurement time through systematic division of the measurement space.
Solution Approach 2:
The patent performs preliminary setting of measurement regions and measurement paths before actual measurement begins. By pre-defining the measurement areas and optimizing the measurement sequence, the system can efficiently cover the entire object without unnecessary movements or repetitions, reducing overall measurement time while ensuring completeness.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables faster and more straightforward shape measurement of complex objects by optimizing the measurement region and movement paths, reducing measurement time and operational complexity.
Implementation Method 1
a projection optical system configured to project, onto a surface of the object to be measured, a line-shaped pattern, or a spot pattern
Implementation Method 2
an image capturing device configured to detect an image of the pattern projected onto the object to be measured
Data Source
AI summary
The purpose of the present invention is to more quickly and easily measure the shape of an object to be measured. A shape measurement device includes: a probe including a projection optical system that projects a line-shaped pattern onto a surface of the object to be measured or projects a spot pattern while scanning in at least a linear scanning range, and an image capturing device that detects an image of the pattern projected onto the object to be measured; a movement mechanism that rotates the object to be measured and the probe relative to each other so that the object to be measured rotates relative to the probe around a rotation axis and moves at least one of the probe and the object to be measured relatively in a direction that intersects with a rotation direction in which the object to be measured rotates; a measurement region setting unit that sets a measurement region of the object to be measured; and an actual measurement region setting unit that sets an actual measurement region including an actual measurement start position and an actual measurement end position on the basis of the measurement region set by the measurement region setting unit. The actual measurement region setting unit sets whichever of the actual measurement start position and the actual measurement end position is closer to a rotation axis center to be closer to the rotation axis than the measurement region, or sets whichever of the actual measurement start position and the actual measurement end position is located further outward in the radial direction to be further from the rotation axis than the measurement range.