Optical Signal Processing for Micro LED Testing
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Solution Overview
Problem
The increasing miniaturization and density of light-emitting devices pose challenges in efficiently testing large numbers of micro light-emitting diodes, as conventional methods like integrating spheres are limited by size and can only handle a few devices at once, leading to inefficiencies and errors due to space constraints and transmission losses.
Innovation Solution
An optical signal processing device with multiple optical signal testing units, each in a one-to-one relation with micro light-emitting diodes, uses optical fibers to transmit and sense optical signals from multiple diodes simultaneously, allowing for faster and more accurate testing by dividing the diodes into testing blocks and alternating their activation periods to minimize interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional integrating sphere methods are used to test light-emitting devices, then measurement accuracy can be maintained, but testing efficiency deteriorates due to space constraints and the ability to handle only a few devices at once
Solution Approach 1:
The patent divides the light-emitting device array into multiple testing blocks, with each block containing a specific number of devices that can be tested simultaneously. This segmentation allows the testing system to handle multiple devices in parallel while maintaining measurement accuracy, thereby improving testing efficiency without sacrificing precision
Solution Approach 2:
The patent transitions from testing devices one by one in a single dimension to testing multiple devices simultaneously by adding spatial dimensionality through multi-channel detection. This enables parallel testing of multiple devices within the integrating sphere, significantly improving productivity while maintaining measurement quality
2Quantity of substance
If the number of light-emitting devices in unit area is increased to meet product requirements, then device density improves, but testing complexity and time increase
Solution Approach 1:
The patent segments the high-density device array into multiple testing blocks that can be tested in parallel. By dividing the total number of devices into manageable groups and testing them simultaneously through multiple channels, the system reduces overall testing time despite the increased device density
Solution Approach 2:
The patent implements continuous testing by alternating between different testing blocks without idle time. The system continuously tests different blocks in sequence, ensuring that the testing process runs without interruption and minimizing the total testing time required for high-density arrays
3Productivity
If multiple micro light-emitting diodes are tested simultaneously using optical fibers, then testing speed increases, but signal interference may occur between adjacent diodes
Solution Approach 1:
The patent segments adjacent light-emitting diodes into different testing blocks with alternating activation. By testing non-adjacent diodes simultaneously (e.g., odd-positioned diodes in one time period, even-positioned diodes in another), the system enables parallel testing while preventing optical signal interference between neighboring devices
Solution Approach 2:
The patent employs periodic activation of different diode groups, alternating between first and second time periods. During each period, specific groups of diodes are activated while others remain inactive, creating a time-division multiplexing scheme that allows simultaneous testing of multiple diodes without signal interference
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces testing time and enhances measurement quality by enabling the simultaneous testing of multiple micro light-emitting diodes with minimal transmission loss, thereby improving the efficiency and accuracy of optical signal measurement processes.
Implementation Method 1
uses optical fibers to transmit and sense optical signals from multiple diodes simultaneously
Implementation Method 2
sensing the first optical signals transmitted from the optical signal testing units during the first time period; sensing the second optical signals transmitted from the optical signal testing units during the second time period; and generating a plurality of sensing signals according to the first optical signals and the second optical signals
Data Source
AI summary
The present disclosure provides an optical signal processing device configured to measure wafer-scale micro LEDs, including optical signal testing units and an optical signal sensing device. The optical signal testing units are configured to transmit optical signals generated by micro LEDs. An optical signal testing unit transmits an optical signal generated by a micro LED. The optical signal sensing device is configured to sense the optical signals transmitted by the optical signal testing units during a plurality of time periods, and is configured to generate sensing signals according to the optical signals.