Optical Speckle Imaging With Wavefront Sensing for Full-Coverage Mapping
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Solution Overview
Problem
Existing optical speckle-based measurement methods suffer from limited sample coverage, lack of spatial resolution, sensitivity, and robustness, especially when measuring macroscopic or diffusive samples, and require complex setups or attachment of targets, leading to incomplete deformation or vibration maps and limited information on surface and interior profiles.
Innovation Solution
An optical speckle-based system with a coherent illumination unit, collection unit, and control unit that adjusts optical properties to generate and capture speckle patterns, allowing full sample coverage with high spatial resolution and sensitivity, using a wavefront imaging sensor to analyze speckle intensity, wavefront, and coherence, and switch between coherent and incoherent light for 2D/3D imaging.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If traditional optical speckle-based measurement methods are used, then measurement capability is provided, but sample coverage is limited and spatial resolution is insufficient
Solution Approach 1:
The illumination is divided into multiple coherent spots that scan across the sample surface. Each spot generates local speckle patterns that are captured and combined to form a complete high-resolution map of the entire sample, resolving the contradiction between coverage area and spatial resolution
Solution Approach 2:
The system transitions from capturing only intensity information to capturing wavefront information (phase, curvature, slope) in addition to intensity. This additional dimensional information enables super-resolution reconstruction that exceeds the diffraction limit of the optical system
2Measurement precision
If traditional speckle measurement is used, then basic measurement is possible, but sensitivity and robustness are insufficient
Solution Approach 1:
The system replaces complex mechanical scanning or multiple camera setups with a computational approach. A single camera captures wavefront information, and digital signal processing algorithms extract high-sensitivity measurements of deformation, vibration, and acoustic signals, achieving high sensitivity without proportional increase in mechanical complexity
Solution Approach 2:
The wavefront information acts as an intermediary that carries additional physical information about the sample's surface characteristics and dynamics. By analyzing wavefront parameters (phase, curvature, slope) in addition to intensity, the system achieves enhanced sensitivity to subtle changes in sample properties
3Area of stationary object
If complex setups with multiple beams are used, then measurement coverage may improve, but system complexity increases and robustness decreases
Solution Approach 1:
The system uses a single illumination beam and single camera setup that can perform multiple measurement functions (deformation mapping, vibration analysis, acoustic signal recovery, surface profiling). This universal approach achieves comprehensive sample coverage while maintaining system simplicity and robustness against environmental disturbances
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables full sample coverage with high spatial resolution for deformation and vibration mapping, providing detailed surface and interior information without complex setups, and facilitating 2D/3D imaging and biometric measurements.
Implementation Method 1
the at least one coherent light source is to generate primary speckles in the sample or thereon
Implementation Method 2
a coherent light source to illuminate a sample; wherein the at least one coherent light source is to generate primary speckles in the sample or thereon
Implementation Method 3
the imaging optics is to capture a secondary speckle pattern induced by the illumination unit in the sample or thereon
Implementation Method 4
capture a secondary speckle pattern induced by the illumination unit
Implementation Method 5
a wavefront imaging sensor; and a control unit coupled to the illumination unit and the collection unit for analyzing the input light and generating a speckle wavefront image
Data Source
AI summary
There are provided systems and methods for imaging, measuring an object, and characterizing a sample. An optical, speckle-based imaging system may comprise an illumination unit comprising at least one coherent light source to illuminate a sample; a collection unit for collecting input light from the sample, the collection unit consisting of an imaging optics and a wavefront imaging sensor; and a control unit coupled to the illumination unit and the collection unit for analyzing the input light and generating a speckle wavefront image, wherein the at least one coherent light source is to generate primary speckles in the sample or thereon, and the imaging optics is to capture a secondary speckle pattern induced by the illumination unit in the sample or thereon.