Coordinate Transformation for Optical-SPM Image Registration
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Solution Overview
Problem
Current methods for combining scanning probe microscopy with optical microscopy face challenges in precise calibration and registration of images, leading to imprecise assignment of pixels and limited informative value, especially in life sciences where optical imaging lacks precise calibration and has different contrast mechanisms.
Innovation Solution
A method that displays an optical image of a measurement sample, allowing users to select positions using a keyboard or mouse, with a coordinate transformation to accurately position the scanning probe microscope's measuring probe relative to the sample, using a displacement device to align the probe with selected positions in the optical image, enabling precise positioning and calibration between optical and scanning probe microscopy images.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If optical imaging is used without precise calibration, then the measurement process is simpler and faster, but the registration precision between optical and SPM images deteriorates
Solution Approach 1:
The patent applies preliminary calibration by establishing a coordinate transformation relationship between the optical microscope and SPM before actual measurements. This involves determining the spatial relationship between the two systems in advance, so that during subsequent measurements, the calibration data is used to accurately register images without repeating the calibration process, thus maintaining both speed and precision.
Solution Approach 2:
The patent uses a coordinate transformation model as an intermediary to bridge the optical microscope and SPM systems. This mathematical model mediates the registration between the two different imaging systems, allowing precise alignment without direct physical connection or real-time calibration adjustments.
2Area of stationary object
If SPM images are used to show large areas, then the coverage area increases, but the measurement probe may be damaged
Solution Approach 1:
The patent segments the measurement process into two parts: optical microscopy provides broad-area overview imaging, while SPM performs localized high-resolution measurements at specific points of interest. This segmentation allows the SPM probe to be protected from damage by limiting its use to targeted areas rather than scanning entire large samples continuously.
Solution Approach 2:
The patent uses optical images as copies or representations of the sample structure to guide SPM measurements. Instead of relying solely on SPM imaging for broad coverage, the optical microscope creates a map of the sample, and the SPM probe follows this map to perform targeted measurements, reducing mechanical stress on the probe.
3Ease of operation
If the measuring probe is displayed in the optical image for positioning, then orientation guidance is provided, but the probe shadows a sub-area making positioning difficult
Solution Approach 1:
The patent extracts the positioning information from the optical image display by using the pre-determined coordinate transformation relationship. Instead of displaying the physical probe in the optical image (which causes shadowing), the system extracts positional data through mathematical transformation, allowing accurate positioning without the probe blocking the view.
Solution Approach 2:
The patent replaces the mechanical visual guidance system (displaying the physical probe in the optical image) with a computational approach using coordinate transformation. This substitution eliminates the shadowing problem while maintaining positioning accuracy through mathematical calculation rather than direct visual reference.
4Adaptability or versatility
If image processing programs are used to match optical and SPM images, then registration is attempted, but the different contrast mechanisms make registration impossible
Solution Approach 1:
The patent changes the fundamental parameter of image registration from matching contrast mechanisms to matching coordinate systems. Instead of trying to align based on similar visual contrasts (which fail when mechanisms differ), the system uses the pre-determined spatial relationship parameters between the two microscopes to establish accurate registration, making the registration robust to different contrast mechanisms.
Data Source
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AI summary
The invention relates to a method for operating a measurement system containing a scanning probe microscope, in particular an atomic force microscope, and to a measurement system for examining a measurement sample using a scanning probe microscope and for optically examining said sample. In the method, an optical image of a measurement section of a measurement sample to be examined, said image being recorded with the aid of an optical recording device, is displayed on a display apparatus, a choice of a position in the optical image is detected, and, for a scanning probe measurement, a measurement probe which is configured for the scanning probe measurement is moved, using a movement apparatus which moves the measurement probe and the measurement sample relative to one another, to a measurement position, which is assigned to the selected position in the optical image in accordance with coordinate transformation, by virtue of the movement apparatus being controlled in accordance with the coordinate transformation, wherein a previously determined assignment between a coordinate system of the optical image and a coordinate system of a space covered by movement positions of the measurement probe and the measurement sample is formed with the coordinate transformation, wherein the movement positions comprise the measurement position.