Optical Surface Inspection Apparatus for Electronic Devices
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Solution Overview
Problem
Current methods for inspecting the surface of electronic devices, such as spectrophotometers, contact type gauges, and naked-eye inspections, face limitations including restricted surface shape and area, measurement errors, and human errors, respectively.
Innovation Solution
An apparatus comprising a seating part, first and second light sources, and cameras, along with an analyzer, which captures color and gloss images of the electronic device's surface using specific lighting and analyzes them to provide quantified and digitized data for accurate quality inspection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a spectrophotometer is used to inspect the surface, then measurement precision is improved, but the surface shape and area are restricted
Solution Approach 1:
The patent uses a camera to capture optical images of the surface instead of direct physical measurement, creating an optical copy that can be analyzed digitally. This allows measurement of complex surface shapes and various areas without physical contact, resolving the contradiction between precision and adaptability.
Solution Approach 2:
The patent replaces the mechanical spectrophotometer system with an optical imaging system using cameras and light sources. This substitution eliminates the need for planar measurement sections and physical contact, enabling measurement of diverse surface geometries while maintaining measurement capability through optical analysis.
2Measurement precision
If a contact type gauge is used to inspect the surface, then measurement precision is improved, but measurement errors and surface defects occur
Solution Approach 1:
The patent replaces contact-type mechanical gauges with a non-contact optical measurement system using cameras and controlled light sources. This eliminates physical contact that causes measurement errors from light interference and prevents surface defects like scratches, while maintaining measurement precision through digital image analysis.
Solution Approach 2:
The patent introduces optical images as an intermediary between the measurement system and the surface. The camera captures reflected light patterns as intermediate data, which is then analyzed to derive surface properties without direct physical contact, avoiding harmful effects while preserving measurement accuracy.
3Ease of operation
If naked eyes are used to inspect the surface, then ease of operation is improved, but human error and personal error increase
Solution Approach 1:
The patent creates digital copies of the surface through camera imaging, replacing direct human visual inspection. These digital images can be analyzed objectively by software, eliminating human error and personal variation while maintaining the simplicity of operation through automated analysis workflows.
Solution Approach 2:
The patent implements an automated feedback system where the camera captures surface images, the system processes them through analysis algorithms, and provides objective measurement results. This closed-loop system eliminates subjective human judgment errors while maintaining ease of operation through automated decision-making.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise and error-free quality inspection of electronic device surfaces by analyzing color and gloss using quantified data, avoiding the limitations of existing methods.
Implementation Method 1
a first light source configured to irradiate a first light onto the surface of the electronic device; a first camera configured to photograph the surface by using the first light
Implementation Method 2
a second light source configured to irradiate a second light onto the surface of the electronic device; a second camera configured to photograph the surface by using the second light
Data Source
AI summary
Various embodiments of the present invention relate to an apparatus and method for measuring the surface of an electronic device, the apparatus comprising: a seating portion on which the electronic device is seated; a first light source for irradiating first light on the surface of the electronic device; a first camera for photographing the surface using the first light; a second light source for irradiating second light on the surface of the electronic device; a second camera for photographing the surface using the second light; and an analyzer electronically connected to the first light source, the first camera, the second light source, and the second camera, wherein the analyzer is setup to analyze the color of the surface acquired using the first light source and the first camera; and the gloss of the surface acquired using the second light source and the second camera, so as to analyze the color and gloss of the surface of the electronic device using quantified and digitized data, thereby enabling quality inspection of the surface of the electronic device without deviation. Various other embodiments are possible.