Optical Surface Measurement Device for Moving Gloss and Thickness Analysis
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Solution Overview
Problem
Existing surface measurement technologies, such as those used in the steel industry, face challenges in accurately determining gloss, refraction index, and thickness of moving or trembling surfaces, leading to unreliable results due to variations in light intensity and focus.
Innovation Solution
The solution involves splitting optical radiation into different wavelengths, focusing them at varying heights of the surface, ensuring that at least some wavelengths remain focused even with surface movement or changes in shape, allowing for the determination of gloss degree and thickness by analyzing the intensity and wavelength of reflected radiation, using detectors that can differentiate intensity values and locate focus points with high precision.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a point-like sensor is used to measure surface gloss in offline mode, then measurement equipment is simple, but measurement speed is slow and real-time control is not enabled
Solution Approach 1:
The patent segments the measurement task by dividing the surface into multiple measurement zones and using multiple sensors arranged in an array. Each sensor measures a specific zone simultaneously, enabling parallel measurement across the entire surface. This segmentation approach transforms a slow sequential point-like measurement into a fast parallel area measurement, achieving real-time measurement capability while maintaining manageable system complexity through modular sensor arrangement.
2Measurement precision
If focused light from the radiation source is used, then measurement precision is improved, but the light may not hit the proper spot on moving or trembling surfaces causing intensity variations
Solution Approach 1:
The patent transitions from a single-point focused measurement to a distributed area measurement by arranging multiple sensors in an array that covers a larger surface area. This dimensional expansion allows the measurement system to capture gloss information from multiple zones simultaneously, making the measurement less sensitive to surface movements or trembling. The area measurement approach compensates for the loss of focus precision by gathering sufficient data from multiple locations, thereby maintaining reliability on moving surfaces.
3Productivity
If the surface is moving or trembling, then productivity is improved through continuous processing, but the intensity of reflected light varies causing unreliable measurements
Solution Approach 1:
The patent implements preliminary action by using multiple sensors to pre-capture measurement data from different surface zones before the surface moves significantly. The sensor array is positioned and configured in advance to cover the expected measurement area, allowing the system to capture stable gloss information from multiple zones simultaneously. This preliminary data capture from multiple zones compensates for surface movements during the measurement process, maintaining measurement consistency while enabling continuous processing and high productivity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables reliable real-time measurement of surface gloss and thickness, even on moving surfaces, allowing for precise control of production processes and improving product quality by enabling real-time adjustments.
Implementation Method 1
splitting optical radiation into different wavelengths
Implementation Method 2
focusing them at varying heights of the surface
Implementation Method 3
intensity of radiation reflected from the surface
Implementation Method 4
detectors that can differentiate intensity values and locate focus points with high precision
Data Source
Figure 1~2b
Figure 2c~2d
Figure 3a~4
AI summary
A measurement device for the determination of the characteristics of the object's surface by means of the optical radiation, wherein a measurement device comprises an optical radiation source and a detector to receive the radiation reflected from the surface being measured. In addition, a measurement device comprises an emitted optical radiation processing unit, which is adjusted to split optical radiation emitted by an optical source into separate wavelengths and to direct said separate wavelengths to the object being measured in a direction, that differs from the normal of the surface being measured so, that at least the shortest and the longest wavelengths of said wavelengths are focused on different halves and different heights of the measured object's surface, in the direction of the normal of the surface being measured. In addition, a measurement device comprises a reflected optical radiation processing unit, which is adjusted to receive an optical radiation reflected from the measured object at least in the direction of a specular reflection, which differs from the normal of the surface being measured, and to direct received optical radiation to said detector. Still further, the measurement device is adjusted to analyze an electric signal produced by the detector and proportional to the intensity of the radiation focused thereto, and to further determine a surface gloss (gloss degree) and/or thickness characteristic property of the measured object, based on the intensity of its wavelength, the focus point of which was located on the measured surface, and which wavelength was the strongest reflected from that point to the detector in the specular geometry.