Optical Telemetry Device Using Diffraction Grating for Axial Precision

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Solution Overview

Problem

Current super-resolution microscopy techniques face challenges in achieving three-dimensional imaging of cellular structures at the nanoscale due to limitations in axial precision, photon budget division, and sensitivity, especially when dealing with high molecule densities and optical aberrations.

Innovation Solution

An optical telemetry device using a two-dimensional detector and a separator element, such as a diffraction grating, to form coherent beams that interfere and determine the distance of a point of light from a reference plane, enabling full-field imaging without controlled illumination and maintaining high resolution.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If PSF shape control techniques are used to determine axial position, then axial localization precision is improved, but the technique fails when molecule density increases due to lobe superposition and enlarged PSFs

Engineering Contradiction:
Improveaxial localization precisionVSAvoidperformance under high molecule density
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent transforms the problem from analyzing complex 3D PSF shape variations to measuring 2D fringe patterns in the image plane. By using a diffraction grating to create interference fringes, the axial position information is encoded in the spatial frequency and orientation of 2D fringes rather than requiring 3D PSF shape analysis, thereby avoiding lobe superposition issues.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The diffraction grating acts as an intermediary element that converts axial position information into measurable fringe patterns. Instead of directly analyzing PSF shape changes, the grating creates an intermediate interference pattern where axial position is encoded in fringe characteristics, making the measurement robust against high molecule density.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Adaptability or versatility

If multi-plane approach is used to image transmitters in axially separate planes, then 3D imaging capability is improved, but sensitivity and precision are reduced due to division of photon budget

Engineering Contradiction:
Improve3D imaging capabilityVSAvoidlocalization precision
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent merges all axial position information into a single 2D image plane through interference fringe patterns. Instead of dividing photons across multiple planes, the entire axial range is encoded in the fringe patterns within one plane, maximizing photon utilization and maintaining high localization precision while achieving full 3D imaging capability.

Inventive Principle:
Principle #5Merging (Combining)

3Measurement precision

If 4pi interferometric system is used to improve axial localization accuracy, then axial precision is significantly improved, but device complexity increases considerably

Engineering Contradiction:
Improveaxial localization accuracyVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts the essential interferometric function from the complex 4pi system and implements it using a simple diffraction grating in the image plane. By taking out only the necessary interference-generating capability and removing the complex dual-objective 4pi architecture, the system achieves comparable axial precision with dramatically reduced complexity.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

Instead of using the complex physical 4pi interferometric arrangement, the patent creates an optical copy of the interference effect using a diffraction grating. The grating replicates the interferometric measurement capability in a simplified configuration that produces equivalent axial localization accuracy without the mechanical and optical complexity of the 4pi system.

Inventive Principle:
Principle #26Copying

4Measurement precision

If PSF shape control techniques are used, then axial position determination is improved, but optical aberrations from deep imaging eliminate the bijective relationship between PSF shape and axial position

Engineering Contradiction:
Improveaxial position determinationVSAvoidoptical aberrations
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent changes the measurement dimension from 3D PSF shape analysis to 2D fringe pattern analysis in the image plane. By encoding axial position in the spatial frequency and orientation of interference fringes rather than PSF shape, the measurement becomes invariant to optical aberrations that distort PSF shapes during deep imaging.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for accurate three-dimensional reconstruction of objects with improved axial precision and sensitivity, suitable for both super-resolution microscopy and passive optical telemetry, without the complexity and sensitivity issues of existing methods.

Implementation Method 1

a separator element making it possible to form, from a beam emitted by a light point from the object-of-interest plane and emerging from the imaging system, at least two beams being coherent with each other, having a spatial superposition region in which the beams interfere

Methodology Applied
Scientific EffectInterference: Interference

Implementation Method 2

the separator element comprises a diffraction grating close to the imaging plane

Methodology Applied
Scientific EffectDiffraction: Diffraction

Data Source

PatentUS10012495B2Optical telemetry device
Publication Date: 2018.07.03 CENT NAT DE LA RECH SCI (C N R S)
  • US10012495B2 patent drawing
  • US10012495B2 patent drawing
  • US10012495B2 patent drawing

AI summary

According to one aspect, the invention relates to a device (100, 200, 300, 400, 500) for measuring the distance, with respect to a reference plane (PREF), from a point of light (Pi) of an object (O). The device comprises a two-dimensional detector (30) comprising a detection plane (PDET) and an imaging system (10) adapted to form an image of a light spot (Pi) situated on an object of interest plane (11) in an image plane (11′) arranged in the vicinity of the detection plane (PDET) or a conjugate plane (P′DET) of the detection plane. The device further comprises a separator element (20) for forming, from a beam emitted by a point of light of the object of interest plane (11), and emerging from the imaging system (10) at least two coherent beams, having a spatial superposition region in which the beams interfere and a signal processing means (50) for determining, from the interference pattern formed on the detection plane, and resulting from the optical interferences between said coherent beams, the distance from the point of light to a conjugate plane of the detection plane in the object space of the imaging system (10), said conjugate plane of the detection plane forming the reference plane (PREF).