Optical Test Apertures for Quantitative Deflection-Angle Measurement

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional contactless test apparatuses using schlieren methods struggle to quantitatively measure the magnitude of refractive index or scattering, limiting their ability to provide accurate measurements.

Innovation Solution

An optical test apparatus comprising a first and second aperture with wavelength selecting regions, an image sensor, and lenses to image light beams passing through these apertures, allowing for the measurement of deflection angles caused by test objects, thereby estimating refractive index distributions and scattering intensities.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional schlieren methods are used for contactless testing, then the presence or absence of refractive index distribution or scattering can be discriminated, but the magnitude of refractive index or scattering cannot be quantitatively measured

Engineering Contradiction:
Improvequantitative measurement capabilityVSAvoidmagnitude information loss
Core Design Contradiction:
Measurement precisionVSLoss of information

Solution Approach 1:

The aperture is divided into multiple wavelength selecting regions, each corresponding to different deflection angle ranges. By segmenting the aperture into distinct regions that select different wavelengths, the system can quantitatively measure deflection angles and refractive index magnitudes rather than merely detecting presence or absence.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent utilizes wavelength (color) selection through different regions of the aperture to encode deflection angle information. Each wavelength selecting region transmits specific wavelengths that correspond to particular deflection ranges, enabling quantitative measurement through color/wavelength analysis of the transmitted light.

Inventive Principle:
Principle #32Color changes

2Measurement precision

If a single aperture is used, then the device structure remains simple, but the ability to measure deflection angles and quantify refractive index distributions is limited

Engineering Contradiction:
Improvedeflection angle measurement accuracyVSAvoidaperture structure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The aperture is segmented into multiple wavelength selecting regions with different transmission characteristics. This segmentation enables precise deflection angle measurement by mapping different angular ranges to specific wavelength regions, while maintaining a relatively simple overall aperture structure without requiring multiple separate components.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The single aperture structure performs multiple functions: it acts as both a spatial filter and a wavelength selector. The different regions of the aperture simultaneously handle different deflection angle ranges and wavelength selections, eliminating the need for multiple separate apertures or components.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables accurate, contactless quantification of refractive index distributions and scattering intensities by measuring deflection angles of light beams, providing detailed information about the test object.

Implementation Method 1

measure deflection angles caused by test objects, thereby estimating refractive index distributions

Methodology Applied
Scientific EffectRefraction: Refraction

Implementation Method 2

estimating refractive index distributions and scattering intensities

Methodology Applied
Scientific EffectScattering: Scattering

Data Source

PatentUS12366526B2Optical test apparatus and optical test method
Publication Date: 2025.07.22 KK TOSHIBA
  • US12366526B2 patent drawing
  • US12366526B2 patent drawing
  • US12366526B2 patent drawing

AI summary

According to one embodiment, an optical test apparatus includes a first aperture, a second aperture, an image sensor, and a first lens. The first aperture includes a first aperture plane provided with a first wavelength selecting region. The second aperture includes a second aperture plane provided with a second wavelength selecting region different from the first wavelength selecting region. The image sensor is configured to image a light beam passing through the first aperture plane and the second aperture plane and reaching an imaging plane. The first lens is configured to make a light beam passing through the first aperture plane and the second aperture plane be incident on the imaging plane.