Optical Tester Socket with Through Hole for Versatile Laser Diode Testing
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Solution Overview
Problem
Conventional optical device testers are limited in their ability to measure various types of optical devices due to specific structural requirements, necessitating dedicated testers for each device, which is costly and inefficient.
Innovation Solution
A versatile tester design that includes a socket with a through hole for light emission and a light receiving element on the first board, allowing for measurements of optical devices with different terminal and light emission orientations, using interchangeable optical filters and reflection mirrors to accommodate diverse device configurations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a conventional tester structure with terminal on socket base top face and light receiving element in cover is used, then the tester can measure optical devices with specific terminal and light emission orientations, but the tester cannot measure optical devices with different terminal and light emission orientations
Solution Approach 1:
The patent applies universality by designing the light receiving element to be mounted on the first board rather than fixed in the cover, enabling the same tester structure to measure optical devices with different terminal and light emission orientations. The socket base with through hole and the movable light receiving element configuration allow the tester to adapt to various device types without requiring dedicated testers for each orientation.
Solution Approach 2:
The patent implements dynamics by making the light receiving element position adjustable or reconfigurable on the first board, allowing the tester to dynamically adapt its measurement configuration. This enables the system to switch between measuring different optical device types by repositioning components rather than requiring fixed dedicated structures for each device type.
2Measurement precision
If dedicated testers are provided for each optical device type, then measurement accuracy for specific device types is ensured, but testing cost increases
Solution Approach 1:
The patent reduces testing cost by designing a universal tester that can measure multiple optical device types with different configurations. The key feature is mounting the light receiving element on the first board rather than fixing it in the cover, which allows one tester to handle various device orientations and types, eliminating the need for multiple dedicated testers while maintaining measurement accuracy through proper optical path alignment.
3Adaptability or versatility
If the light receiving element is mounted on the first board at a position corresponding to the through hole, then the tester can accommodate optical devices with different orientations, but the optical path alignment becomes more complex
Solution Approach 1:
The patent uses the through hole in the socket base as an intermediary optical element that facilitates light transmission from the optical device to the light receiving element mounted on the first board. This intermediary structure simplifies the optical path alignment by providing a defined light transmission channel, making it easier to accommodate different device orientations without requiring complex alignment mechanisms.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables cost-effective testing of multiple optical device types with different terminal and light emission orientations using a single tester, reducing the need for dedicated testers and improving manufacturing efficiency.
Implementation Method 1
a light receiving element 14 for measuring an output of light emitted from the optical device
Implementation Method 2
The optical filter 15 is used for attenuating the output of the outgoing light emitted from the semiconductor laser element 111
Data Source
AI summary
A tester according to the present invention can conduct a test on optical devices each having a different positional relation between a position of a contact face of an external contact terminal and a direction of light emitted from a semiconductor laser element.