Optical Tomography Imaging System Using Simplified Demodulation

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Solution Overview

Problem

Structured illumination microscopic imaging technology has limitations in imaging speed for large-size samples, requires additional modulation elements, and is heavily dependent on modulation pattern contrast, with a complex demodulation algorithm, which hampers its efficiency and imaging throughput.

Innovation Solution

A high-throughput optical sectioning imaging method and system that modulates a light beam with incompletely identical intensities, allowing imaging in different rows of pixels and using a simplified demodulation algorithm to obtain focal plane images, where the demodulation formula is I in = c × | β I 1 - α I 2 |, with α and β being positive integers, to improve reconstruction efficiency and imaging speed.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If structured illumination microscopic imaging technology is used to achieve optical sectioning, then optical sectioning capability is improved, but imaging speed for large-size samples deteriorates due to multiple scanning and mosaic stitching requirements

Engineering Contradiction:
Improveoptical sectioning capabilityVSAvoidimaging speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent segments the imaging process into two distinct modes: a fast scanning mode for large-size samples that provides overview imaging, and a high-resolution mode for detailed optical sectioning of specific regions. This segmentation allows the system to avoid time-consuming mosaic stitching for large samples while maintaining optical sectioning capability when needed.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements dynamic switching between different imaging modes based on the sample size and imaging requirements. The system can dynamically adjust the illumination pattern and scanning strategy, transitioning from structured illumination for small regions to wide-field scanning for large samples, thereby optimizing imaging speed while preserving optical sectioning capability when applicable.

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If conventional structured illumination microscopic imaging method is used, then optical sectioning is achieved, but system complexity increases due to requirement of light beam modulation devices

Engineering Contradiction:
Improveoptical sectioning capabilityVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts and removes the complex light beam modulation devices from the imaging system. Instead of using traditional structured illumination with phase-modulated patterns, the system achieves optical sectioning through computational methods and simplified illumination schemes, eliminating the need for additional modulation components.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent replaces the mechanical/optical modulation system with a computational approach. Rather than physically modulating the light beam through complex optical elements, the system uses digital signal processing and algorithmic methods to achieve the same optical sectioning effect, thereby simplifying the physical hardware.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If conventional structured illumination microscopic imaging method is used, then optical sectioning is achieved, but imaging speed deteriorates due to requirement of scanning back and forth three times

Engineering Contradiction:
Improveoptical sectioning capabilityVSAvoidimaging time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent performs preliminary fast scanning to acquire an overview of the large-size sample before conducting detailed optical sectioning. By预先 (in advance) identifying regions of interest through rapid wide-field imaging, the system avoids time-consuming multiple scans of the entire large sample, reducing total imaging time while preserving optical sectioning capability for critical areas.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements a two-stage imaging strategy where the first stage rapidly scans the entire large sample to identify important features, and the second stage applies structured illumination only to selected regions of interest. This skipping approach rushes through the time-consuming parts by avoiding unnecessary scans of irrelevant areas, significantly reducing total imaging time.

Inventive Principle:
Principle #21Skipping (Rushing through)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach simplifies the structured illumination microscopic reconstruction algorithm, enhances imaging speed for large-size samples, and reduces system complexity by using a light beam with incompletely identical modulated intensities and a straightforward demodulation process.

Implementation Method 1

modulating a light beam into a modulated light beam capable of being focused on a focal plane of an objective lens and being defocused on a defocusing plane of the objective lens

Methodology Applied
Scientific EffectLight focusing and defocusing: Focusing

Implementation Method 2

imaging, by a camera, in different rows of pixels, a same sample under illumination of the modulated light beam to form sample images

Methodology Applied
Scientific EffectOptical imaging: Photography

Implementation Method 3

obtaining focal plane images of the sample images in the different rows of pixels by demodulating the sample images according to a demodulation algorithm, the focal plane image being an optical sectioning image

Methodology Applied
Scientific EffectOptical sectioning: Tomography

Data Source

PatentEP3875945B1High-throughput optical tomography method and imaging system
Publication Date: 2024.09.04 HUST SUZHOU INST FOR BRAINMATICS
  • EP3875945B1 patent drawingFigure 1~3
  • EP3875945B1 patent drawingFigure 4~5
  • EP3875945B1 patent drawingFigure 6~7

AI summary

The present disclosure discloses a high-throughput optical sectioning imaging method and imaging system. The method includes: modulating a light beam into a modulated light beam capable of being focused on a focal plane of an objective lens and being defocused on a defocusing plane of the objective lens, the modulated light beam having incompletely identical modulated intensities on the focal plane of the objective lens; imaging, in different pixels, a sample under illumination of the modulated light beam to obtain sample images in the different pixels; obtaining focal plane images of sample images in the different pixels by demodulation of the sample images according to a demodulation algorithm. The system includes a light beam modulation module, an imaging module and a demodulation module. The present disclosure performs illumination by a light beam having incompletely identical modulated intensities, images a same sample in different pixels, and obtains a focal plane image by using a simpler demodulation algorithm, which simplifies a structured light reconstruction algorithm, improves reconstruction efficiency, and improves an imaging speed of large-size samples.