Deterioration diagnosis device and deterioration diagnosis method of optical transceiver
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Solution Overview
Problem
Conventional methods for diagnosing optical transceiver deterioration are time-consuming and costly, with accuracy deteriorating due to variations in transceiver characteristics, and temperature testing can be challenging, especially when using a temperature table created for typical transmitters on other transmitters.
Innovation Solution
A deterioration diagnosis device that acquires and stores initial temperature and bias current data, calculates a correction function to account for temperature variations, and uses this function to correct bias currents, thereby improving the accuracy of deterioration calculations without the need for a pre-created temperature table.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of time
If a temperature table is created for typical optical transmitters and applied to other transmitters, then testing time and cost are reduced, but diagnosis accuracy deteriorates due to variation in characteristics between transmitters
Solution Approach 1:
The system performs self-characterization by automatically measuring its own temperature-bias current relationship during initial operation, eliminating the need for external temperature chamber testing. The optical transmitter itself generates the calibration data needed for accurate deterioration diagnosis without requiring manual intervention or specialized testing equipment.
Solution Approach 2:
The system dynamically adjusts the bias current based on measured temperature variations and establishes a unique temperature-bias current characteristic curve for each transmitter. This parameter-based approach replaces fixed temperature table lookup with adaptive parameter adjustment, allowing accurate diagnosis across varying operating conditions while maintaining individual transmitter specificity.
2Measurement precision
If temperature testing is performed on each optical transmitter to create accurate temperature tables, then diagnosis accuracy is improved, but testing time and cost increase significantly
Solution Approach 1:
The optical transmitter performs self-characterization by automatically measuring its own temperature-bias current relationship during normal operation. This eliminates the need for external temperature chamber testing and manual data collection, significantly reducing testing time and cost while maintaining high accuracy through self-generated calibration data.
Solution Approach 2:
The patent replaces mechanical temperature chamber testing with an electronic/software-based self-measurement system. Instead of physically placing each transmitter in a temperature chamber to collect data, the system uses internal sensors and processing to automatically characterize temperature-bias current relationships, eliminating complex mechanical testing infrastructure.
3Device complexity
If conventional temperature table methods are used, then the system is simple to implement, but accuracy deteriorates due to environmental temperature variations affecting bias current measurements
Solution Approach 1:
The system continuously monitors temperature and uses this feedback to dynamically adjust bias current measurements. By establishing a unique temperature-bias current characteristic curve for each transmitter and using real-time temperature data, the system compensates for environmental variations and maintains accurate deterioration diagnosis without requiring complex external control systems.
Data Source
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AI summary
There are provided: a temperature acquisition unit (111) that acquires a temperature of an optical transceiver (101) including a laser diode (105) outputting an optical transmission signal; a bias current acquisition unit (112) that acquires a bias current flowing through the laser diode (105); a correction function calculation unit (114) that calculates a correction function representing a relationship between the acquired temperature and bias current; a temperature correction value calculation unit (116) that calculates a temperature correction value for a bias current acquired at the time of deterioration diagnosis, using the correction function; a corrected bias current calculation unit (117) that corrects the bias current acquired at the time of the deterioration diagnosis, using the temperature correction value; and a bias current change amount calculation unit (118) that determines a state of the laser diode (105) by comparing an initial bias current with a corrected bias current, the initial bias current being an initial value of the bias current, the corrected bias current being obtained by correcting the bias current.