Optical Triangulation for Absorbent Structure Topography

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Solution Overview

Problem

Existing sensor technologies in absorbent article manufacturing lines cannot provide detailed information about the surface topography and thickness of absorbent cores and acquisition layers, which are crucial for improving wearer fit, comfort, and liquid absorption efficiency.

Innovation Solution

An inspection system that senses distortions in patterns of reflected light to create profiles representing surface topographies of absorbent structures during manufacturing, using sensors and a radiation source to triangulate changes in elevation and communicate with a controller to monitor and control the manufacturing process.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If existing sensor technology is used to detect components and positions, then basic presence and position information is obtained, but detailed surface topography and thickness information of absorbent structures cannot be provided

Engineering Contradiction:
Improvesurface topography measurementVSAvoidabsorbent structure characteristics
Core Design Contradiction:
Measurement precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The patent replaces traditional mechanical contact-based measurement systems with an optical measurement system. A light source projects light patterns onto the absorbent structure, and sensors detect reflected light to create topography profiles. This non-contact optical method enables detailed surface and thickness measurement without physical contact, resolving the contradiction between measurement precision and detection difficulty.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the measurement parameter from basic position detection to optical reflectivity patterns. By analyzing how light reflects off the absorbent structure's surface, the system extracts detailed topography and thickness information. This parameter transformation enables precise measurement of soft, compliant absorbent materials that are difficult to measure traditionally.

Inventive Principle:
Principle #35Parameter changes

2Adaptability or versatility

If absorbent structures are constructed with varying thicknesses and shapes to improve wearer fit and comfort, then product performance is improved, but quality control and monitoring become more difficult

Engineering Contradiction:
Improveabsorbent structure configurationVSAvoidquality control
Core Design Contradiction:
Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The patent implements a feedback mechanism where optical sensors continuously monitor the absorbent structure's surface topography during manufacturing. The system detects variations in thickness and shape in real-time, providing feedback to control mechanisms that can adjust manufacturing parameters. This enables precise quality control of complex, variable configurations while maintaining adaptability.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent substitutes mechanical measurement methods with optical profiling to monitor varying absorbent structure configurations. The optical system non-contactly captures surface topography data, enabling quality control of complex three-dimensional structures with varying thicknesses without the constraints of mechanical measurement systems.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If detailed optical profiling is implemented to measure surface topography, then measurement capability is improved, but device complexity increases

Engineering Contradiction:
Improvesurface topography profileVSAvoidinspection system
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent creates a multi-functional optical inspection system that can measure multiple parameters (surface topography, thickness, shape variations) using a single integrated setup. The light source and sensor array serve multiple measurement functions simultaneously, reducing the need for separate specialized devices and thereby limiting the increase in overall system complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent uses a simplified optical measurement approach that captures sufficient topography information through basic light reflection patterns, rather than employing overly complex measurement systems. The method extracts necessary measurement data from fundamental optical interactions, avoiding unnecessary system complexity while achieving required measurement precision.

Inventive Principle:
Principle #16Partial or excessive action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables detailed monitoring and control of absorbent structure construction, enhancing the quality and performance of absorbent articles by providing precise information on surface topography and thickness, thereby improving fit and liquid handling capabilities.

Implementation Method 1

sensing distortions in patterns of light reflected from the illuminated surface of the absorbent structure

Methodology Applied
Scientific EffectLight reflection: Reflection

Implementation Method 2

triangulates changes in elevation of the illuminated surface of the absorbent structure relative to the sensor

Methodology Applied
Scientific EffectTriangulation: Parallax

Data Source

PatentEP3110380B1Methods for profiling surface topographies of absorbent structures in absorbent articles
Publication Date: 2018.09.26 PROCTER & GAMBLE CO
  • EP3110380B1 patent drawingFigure 1
  • EP3110380B1 patent drawingFigure 2
  • EP3110380B1 patent drawingFigure 3~4

AI summary

The present disclosure relates to methods and apparatuses for sensing distortions in patterns of reflected light to create profiles representing surface topographies of absorbent structures during the manufacture of absorbent articles. Inspection systems may include sensors arranged adjacent an advancing absorbent structure on a converting line. In turn, a controller may monitor and affect various operations on the converting line. The inspection systems herein may also include a radiation source that illuminates a surface of an absorbent structure with a predetermined pattern of light extending in the cross direction CD. The sensor senses distortions in patterns of light reflected from the illuminated surface of the absorbent structure and triangulates changes in elevation of the illuminated surface of the absorbent structure relative to the sensor. Based on the triangulated changes in elevation, the sensor creates a profile representing a surface topography of the illuminated surface of the absorbent structure.