Optoelectrical Chip Wavelength Filter Beam Splitter Removal
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Solution Overview
Problem
Conventional optoelectrical chips are complex and have low sensitivity due to the use of a beam splitter, which attenuates light intensity and increases manufacturing costs.
Innovation Solution
An optoelectrical chip design that eliminates the need for a separate beam splitter by utilizing a wavelength-sensitive optical filter that functions as both a transmission and reflection element, allowing direct measurement of light intensities and improving the signal-to-noise ratio through energy conservation, with an integrated evaluation circuit for spectrum analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a beam splitter is used to divide light into first and second light fractions, then the spectral properties can be measured, but the device complexity increases and sensitivity decreases due to light attenuation
Solution Approach 1:
The beam splitter is completely removed from the system. Instead of dividing light into multiple fractions using a beam splitter, the patent uses a wavelength-sensitive optical filter that transmits only specific wavelengths, eliminating the need for separate beam splitting components and reducing overall device complexity.
Solution Approach 2:
The optical filter serves multiple functions simultaneously: it acts as both the wavelength-selective filtering element and the beam splitter alternative. By combining the filtering function with the light division function in a single component, the system reduces complexity while maintaining measurement capability.
2Measurement precision
If a beam splitter is used to divide light, then spectral measurement is enabled, but manufacturing costs increase
Solution Approach 1:
The beam splitter component is extracted and removed from the system. The patent replaces it with a wavelength-sensitive optical filter that can be integrated directly into the chip structure, reducing the number of manufacturing steps and components required, thereby lowering manufacturing costs.
Solution Approach 2:
The optical filter is merged with the chip substrate, integrating the filtering function directly into the device structure. This consolidation eliminates the need for separate beam splitter components and simplifies the manufacturing process, reducing overall manufacturing costs.
3Measurement precision
If a beam splitter is used to divide light into first and second light fractions, then measurement is possible, but light intensity is attenuated reducing signal quality
Solution Approach 1:
The patent converts the wavelength-selective property of the optical filter, which initially might seem like a limitation, into a benefit. By allowing only specific wavelengths to pass through to the photoelectric element, the system improves signal quality and reduces noise, effectively converting what could be seen as energy loss into enhanced measurement precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution reduces manufacturing costs, enhances sensitivity, and doubles the efficiency of the optoelectrical chip by eliminating the need for a separate beam splitter, while maintaining the integrity of the light path and improving signal quality.
Implementation Method 1
a wavelength-sensitive optical filter
Implementation Method 2
light entering into the optoelectrical chip via the light inlet opening, which is reflected at the filter
Implementation Method 3
a first photoelectric element for measuring a first light intensity, particularly a first photodiode
Implementation Method 4
a second photoelectric element for measuring a second light intensity, particularly a second photodiode
Data Source
AI summary
The invention relates to an optoelectronic chip comprising the following elements: a light inlet; a wavelength-sensitive optical filter; a first photoelectric element for measuring a first light intensity, particularly a first photodiode, the first photoelectric element being arranged such that light penetrating the optoelectronic chip via the light inlet, transmitted by the filter, hits the first photoelectric element; and a second photoelectric element for measuring a second light intensity, particularly a second photodiode, the second photoelectric element being arranged such that the light penetrating the optoelectronic chip via the light inlet, which is reflected by the filter, hits the second photoelectric element.


