Optoelectronic Gas Analysis Ionizer Deflection

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Solution Overview

Problem

Optoelectronic apparatuses for gas analysis face interference from high particle loads such as smoke and dust, which cause light absorption and scattering, making it difficult to differentiate between gas constituents and particle-induced absorption in industrial emission measurements.

Innovation Solution

An optoelectronic apparatus with an ionizer and ion acceleration apparatus, using electric or magnetic fields to ionize particles and deflect them away from the measurement volume, ensuring that only the gas constituents are measured, thereby reducing interference from particles.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-affected harmful factors

If extractive gas analysis with filters is used, then particle interference is reduced, but device complexity and maintenance requirements increase

Engineering Contradiction:
Improveparticle interferenceVSAvoidfilter system complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The harmful particles are extracted and removed from the gas flow through an electrostatic precipitator that ionizes particles and collects them on charged electrodes, separating the measurement path from particle interference without requiring complex filtration systems

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The mechanical filter system is replaced by an electrostatic field-based particle removal system that uses ionization and electrostatic attraction to remove particles, eliminating the need for mechanical filters and their associated maintenance

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Ease of operation

If in-situ gas analysis is performed, then maintenance is reduced, but particle interference increases

Engineering Contradiction:
Improvemaintenance requirementVSAvoidparticle interference
Core Design Contradiction:
Ease of operationVSObject-affected harmful factors

Solution Approach 1:

The measurement system is segmented into a particle-free measurement zone and a particle-containing gas flow zone, with an electrostatic precipitator creating a localized clean path for optical measurement while the gas flow continues undisturbed

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

An electrostatic precipitator acts as an intermediary device that selectively removes particles from the gas flow before measurement without requiring extraction or modification of the gas flow path, enabling in-situ analysis with reduced particle interference

Inventive Principle:
Principle #24Intermediary (Mediator)

3Measurement precision

If electric filters are used to remove particles, then measurement accuracy improves, but energy consumption increases

Engineering Contradiction:
Improvegas concentration measurement accuracyVSAvoidenergy consumption
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The electrostatic precipitator applies ionization and electrostatic collection only to the extent necessary to achieve adequate particle removal for accurate measurement, using minimal energy to create localized electric fields in the measurement path rather than treating the entire gas flow

Inventive Principle:
Principle #16Partial or excessive action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively reduces particle interference, allowing for accurate measurement of gas constituents without the need for additional gas treatment, maintaining in-situ analysis capabilities and enabling the measurement of particle concentration and size distribution.

Implementation Method 1

an ionizer is further provided which is arranged upstream of the optical measurement path. The ionizer causes an ionization of the inferring particles

Methodology Applied
Scientific EffectIonization: Ionisation

Implementation Method 2

The ion acceleration apparatus and/or its electromagnetic fields is/are designed such that the generated ions experience a deflection

Methodology Applied
Scientific EffectElectric field: Electric Field

Implementation Method 3

the ion acceleration apparatus and/or its electromagnetic fields is/are designed such that the generated ions experience a deflection so that they can flow past the measurement volume

Methodology Applied
Scientific EffectElectromagnetic field: Electromagnetic Induction

Data Source

PatentUS8749788B2Optoelectronic apparatus for gas analysis and method
Publication Date: 2014.06.10 ENDRESSHAUSER SICK GMBHCO KG
  • US8749788B2 patent drawing
  • US8749788B2 patent drawing
  • US8749788B2 patent drawing

AI summary

The invention relates to an improved optoelectronic apparatus for optical gas analysis by means of which the interfering influence of the particles contained in the gas is reduced with regard to the intended measurement. For this purpose the optoelectronic apparatus in accordance with the invention has a light transmitter and a light receiver which define an optical measurement path including a measurement volume between one another. The received signals of the light receiver can be evaluated in an evaluation unit, to ultimately obtain the desired information therefrom, for example, the concentration of a specific gas content. In accordance with the invention an ionizer is further provided which is arranged upstream of the optical measurement path. The ionizer causes an ionization of the undesirable particles, i.e. e.g. the dust particles, smoke particles or such like aerosols so that the ionized particles can be deflected by electric fields or also magnetic fields by means of an ion acceleration apparatus. In this respect the ion acceleration apparatus and/or its electromagnetic fields is/are aligned such that the generated ions experience a deflection to be able to flow past the measurement volume.