Optoelectronic IC Test Fixture With Multi-Level Optical Coupling
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
There is a lack of test devices for optoelectronic integrated circuits that can accommodate customized designs, hindering effective testing of these circuits.
Innovation Solution
A test device for optoelectronic integrated circuits featuring multiple light transmission components at varying vertical levels and orientations, including optical fibers and connectors, to facilitate diverse optical coupling configurations, accommodating different circuit designs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a single test device is used for optoelectronic integrated circuits, then the device structure is simple, but it cannot accommodate customized designs and different circuit configurations
Solution Approach 1:
The test device is designed with multiple light transmission components (first light transmission component, second light transmission component, third light transmission component) that can accommodate different optical coupling configurations. These components include various connectors and optical fibers arranged at different positions and orientations, enabling the same test device to test different optoelectronic integrated circuit designs through selective connection configurations
Solution Approach 2:
The patent introduces vertical level differentiation with light transmission components positioned at first, second, and third vertical levels relative to the carrier surface. This multi-level spatial arrangement allows optical signals to be transmitted from different directions (side coupling, top coupling) to the optical waveguide, providing versatile testing capabilities without requiring multiple separate test devices
2Adaptability or versatility
If multiple light transmission components are added to accommodate different designs, then adaptability improves, but device complexity increases
Solution Approach 1:
The test device is segmented into multiple independent light transmission components (first light transmission component with first connector, second light transmission component with second connector, third light transmission component with third connector). Each component can be independently configured and connected to the optoelectronic integrated circuit at different positions and orientations, allowing flexible combination to match different testing requirements without requiring complete redesign of the entire test device
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables comprehensive electrical testing of optoelectronic integrated circuits with varied designs by providing flexible optical signal transmission paths, overcoming limitations of single-test equipment.
Implementation Method 1
The first light transmission component further includes a first optical fiber, a first joint, and a first connector... The first optical fiber includes the first transmission portion, the optoelectronic integrated circuit includes a first optical waveguide, and the first optical fiber is parallel to and faces the first optical waveguide
Implementation Method 2
The second connector of the second light transmission component includes a reflective wall arranged at an acute angle with respect to the second optical fiber and the carrier surface... the test optical signal transmitted by the second transmission portion is reflected to the second optical waveguide through the reflective wall
Implementation Method 3
the inclined portion is arranged at an acute angle with respect to the second optical fiber and the carrier surface and comprises a reflective material with a refractive index greater than that of air... the test optical signal transmitted by the second transmission portion is reflected to the second optical waveguide through the inclined portion
Implementation Method 4
The third transmission portion is inclined to the carrier surface and is configured to transmit a test optical signal directly emitted to the third optical waveguide from above the optoelectronic integrated circuit
Data Source
AI summary
A test device for an optoelectronic integrated circuit includes a circuit board, a connecting base, a first light transmission component, and a second light transmission component. The connecting base is arranged on the circuit board and includes a carrier board and a frame. The optoelectronic integrated circuit is arranged on a carrier surface of the carrier board. The first light transmission component is arranged on a side of the frame, includes a first transmission portion, and is located at a first vertical level with respect to the carrier surface. The second light transmission component is arranged on another side of the frame, includes a second transmission portion, and is located at a second vertical level with respect to the carrier surface. A height of the second vertical level is different from a height of the first vertical level.