Optoelectronic Measuring Device with Optical Path Adjusting Module
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Solution Overview
Problem
Current optoelectronic measuring devices face instability and error in measurements due to frequent movement of objective and imaging lenses, and require multiple test stations, leading to potential damage and inefficient use of factory space.
Innovation Solution
An optoelectronic measuring device with an optical path adjusting module, comprising a mirror that adjusts the distance between the imaging lens and camera, allowing for stable measurement of laser diode characteristics without moving the lenses, and integrating luminance-current-voltage testing using a beam splitter.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the objective lens or imaging lens is frequently moved to perform different measurements, then multiple measurements (beam waist, divergence angle, numerical aperture) can be obtained, but the stability of the optical framework deteriorates and measurement errors increase
Solution Approach 1:
The patent segments the measurement functions by introducing a beam splitter that directs different portions of the laser beam to different detection modules. Each module (beam waist detector, divergence angle detector, numerical aperture detector) remains stationary while performing its specific measurement, eliminating the need to move lenses and maintaining optical stability.
Solution Approach 2:
The beam splitter acts as an intermediary element that enables multiple measurements without requiring physical movement of the objective or imaging lenses. By redirecting the light path to different stationary detectors, the system achieves versatile measurement capability while maintaining the stability of the optical framework.
2Adaptability or versatility
If multiple separate test stations are used for different measurements, then comprehensive testing can be performed, but the device complexity increases and factory space is occupied
Solution Approach 1:
The patent merges multiple separate test stations into a single integrated measurement system. The beam splitter divides the laser beam to simultaneously feed multiple detection modules (beam waist, divergence angle, numerical aperture detectors) within one optical framework, reducing device complexity and factory space requirements while maintaining comprehensive testing coverage.
Solution Approach 2:
The single optical framework is designed with multi-functionality, capable of performing beam waist measurement, divergence angle measurement, and numerical aperture measurement through the beam splitter and multiple stationary detection modules, eliminating the need for separate dedicated test stations for each measurement type.
3Adaptability or versatility
If multiple separate test stations are used for different measurements, then comprehensive testing can be performed, but the risk of laser diode damage during transition increases
Solution Approach 1:
The measurement system segments the laser beam using a beam splitter to direct different portions to different stationary detection modules. This eliminates the need to physically move or transition the laser diode between separate test stations, thereby removing the mechanical handling steps that pose damage risks during transitions.
Solution Approach 2:
The beam splitter serves as an intermediary that enables comprehensive measurement capability without requiring physical transition or movement of the laser diode between test stations. The laser diode remains stationary throughout the measurement process, eliminating the harmful mechanical handling that could cause damage.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Maintains optical framework stability, reduces measurement errors, and integrates multiple tests, saving space by avoiding lens movement and utilizing high-intensity laser light for LIV testing.
Implementation Method 1
the mirror reflects the third testing light vertically
Data Source
AI summary
Herein disclosed is an optoelectronic measuring device. The optoelectronic measuring device comprises an objective lens, an imaging lens, a camera, and an optical path adjusting module which are disposed at the first light path. The objective lens receives a first testing light, and transforms the first testing light into a second testing light. The imaging lens receives the second testing light, and transforms the second testing light into a third testing light. The camera measures a beam characteristic of the third testing light. The optical path adjusting module, disposed between the imaging lens and the camera, comprises a mirror, the mirror moves relatively to the imaging lens according to a test command, and adjusts the distance between the imaging lens and the camera at the first light path to be a first optical distance or a second optical distance. Wherein the mirror reflects the third testing light vertically.