Optoelectronic Sensor Diagonal Beam Overlap Resolution
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Solution Overview
Problem
Light grids face limitations in resolution and accuracy for detecting small objects and measuring object dimensions due to the fixed beam spacing, which restricts their ability to provide precise geometric mapping and distinguish between object presence and ambient conditions.
Innovation Solution
The implementation of special beam-shaping optics that overlap diagonally or perpendicularly in the monitoring field allows for differential signal evaluation, increasing resolution without adding more beams, enabling sub-pixel location of small objects and distinguishing between object presence and ambient conditions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If beam spacing is reduced to increase resolution, then detection performance for small objects is improved, but device complexity and costs increase due to additional transmission and reception elements
Solution Approach 1:
The patent applies dimensionality change by tilting the light beams at an angle (e.g., 45 degrees) relative to the monitoring area plane. This angular arrangement creates additional measurement dimensions, allowing the system to determine object height and thickness through geometric relationships rather than simply increasing beam density in the vertical direction.
Solution Approach 2:
The patent changes the spatial parameter of beam arrangement by introducing angular deviation from the vertical axis. Instead of parallel vertical beams, the beams are directed at oblique angles, transforming the measurement geometry to enable height and thickness determination through trigonometric relationships and shadow analysis.
2Measurement precision
If additional transmission and reception elements are added to decrease beam spacing, then resolution is improved, but response time increases due to extended evaluation cycle
Solution Approach 1:
By introducing angularly tilted beams, the system gains additional measurement information from the same number of beams. The oblique arrangement creates varying shadow patterns and light path lengths that provide height and thickness data without requiring more beams or longer evaluation cycles.
Solution Approach 2:
The tilted beam arrangement enables multiple measurement functions (height determination, thickness measurement, object detection) to be performed simultaneously using the same beam configuration, making the system multi-functional without additional hardware or time expenditure.
3Reliability
If cross-beam technology is used to detect objects between beams, then detection capability is improved, but response time increases and geometric mapping is lost
Solution Approach 1:
The patent uses angularly tilted beams that create diagonal monitoring paths across the measurement area. This angular arrangement naturally provides overlapping coverage and multiple detection paths without requiring cross-beam evaluation, maintaining response time while improving detection capability through geometric redundancy.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the resolution of light grids, allowing for geometric mapping and precise measurement of object height and thickness with sub-pixel accuracy, while maintaining constant evaluation time and distinguishing between object presence and ambient conditions.
Implementation Method 1
A transmission unit comprises a plurality of light transmitters (14) arranged in a row, for example LEDs or lasers
Implementation Method 2
The light beams (18) are shaped by respective transmission optics (16) and impinge via reception optics (24) on light receivers (26)
Implementation Method 3
The light beams (18) are shaped by respective transmission optics (16) and impinge via reception optics (24) on light receivers (26)
Implementation Method 4
The light beams (18) are shaped by respective transmission optics (16) and impinge via reception optics (24) on light receivers (26)
Data Source
AI summary
An optoelectronic sensor (10) is provided with a plurality of light transmitters (14) and light receivers (26) that form between one another a field (20) of mutually parallel monitoring beams (18), wherein beam shaping optics (16, 24) are assigned to the light transmitters (14) and the light receivers (26). The optics (16, 24) comprise a geometry and arrangement leading to a mutual overlap of the optics (16, 24) in a direction diagonal, in particular perpendicular, to the field (20).